TY  - CONF

T1  - Identification of Impurities and Defects in Semiconductors by Optical Spectroscopy

JO  - MRS Proceedings

PY  - 1985/12/01

AU  - Skolnick MS

ED  - 

DO  - DOI: 10.1557/proc-46-27

PB  - Cambridge University Press (CUP)

VL  - 46

Y2  - 2025/04/22

ER  -