TY  - JOUR

T1  - Turn-On Characteristics of Polycrystalline Silicon TFT's - Impact of Hydrogenation and Channel Length

JO  - IEEE Electron Device Letters

PY  - 1999/01/01

AU  - Xu YZ

AU  - Clough FJ

AU  - Narayanan EMS

AU  - Chen Y

AU  - Milne WI

ED  - 

DO  - DOI: 10.1109/55.740658

VL  - 20

IS  - 2

SP  - 80

EP  - 82

Y2  - 2024/12/20

ER  -