TY  - CONF

T1  - Application of a new method for measuring small amounts of dopants at planar faults: tin-rich inversion boundaries in zinc oxide

CY  - Herentals

PY  - 2004/01/01

AU  - Daneu N

AU  - Walther T

AU  - Recnik A

ED  - Schryvers D

ED  - Timmermans J-P

PB  - Belgian Society for Microscopy, Liege

VL  - 3

SP  - 63

EP  - 64

Y2  - 2024/12/20

ER  -