TY  - JOUR

T1  - An improved approach to quantitative X-ray microanalysis in (S)TEM: Thickness dependent k-factors

JO  - Journal of Physics: Conference Series

PY  - 2010/01/01

AU  - Walther T

ED  - 

DO  - DOI: 10.1088/1742-6596/241/1/012016

VL  - 241

Y2  - 2024/12/20

ER  -