@inproceedings{inproceedings, title  = {{Early stage hot carrier degradation of state-of-the-art LDD N-MOSFETs}},

 publisher = {{IEEE}},

 url = {{}},

 year = {{2000}},

 month = {{1}},

 author = {{Manhas SK and de Souza MM and Gates AS and Chetlur SC and Sankara Narayanan EM}},

 doi = {{10.1109/relphy.2000.843899}},

 journal = {{2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)}},

 note = {{Accessed on 2024/12/20}}}