TY  - CONF

T1  - The determination of absorption parameters in Si and GaAs using energy filtered imaging

JO  - ELECTRON MICROSCOPY AND ANALYSIS 1995

PY  - 1995/01/01

AU  - DuninBorkowski RE

AU  - Schaublin RE

AU  - Walther T

AU  - Boothroyd CB

AU  - Preston AR

AU  - Stobbs WM

ED  - Cherns D

VL  - 147

SP  - 179

EP  - 182

Y2  - 2024/10/23

ER  -