TY  - CONF

T1  - Quantifying the Top-Bottom Effect in Energy-Dispersive X-Ray Spectroscopy of Nanostructures Embedded in Thin Films

JO  - MICROSCOPY OF SEMICONDUCTING MATERIALS 2007

PY  - 2008/01/01

AU  - Walther T

ED  - Cullis AG

ED  - Midgley PA

VL  - 120

SP  - 185

EP  - 188

Y2  - 2024/10/23

ER  -