TY  - JOUR

T1  - Metrological aspects of Electron Backscattering Diffraction in characterising hot deformation grain structures

JO  - MAPAN-J METROL SOC I

PY  - 2007/07/01

AU  - Mingard KP

AU  - Roebuck B

AU  - Bennett EG

AU  - Thomas M

AU  - Wynne BP

AU  - Palmiere EJ

ED  - 

VL  - 22

IS  - 3

SP  - 177

EP  - 200

Y2  - 2024/12/22

ER  -