TY  - JOUR

T1  - The effect of oxide overlayers on secondary electron dopant mapping.

JO  - Microsc Microanal

PY  - 2009/06/01

AU  - Dapor M

AU  - Jepson MAE

AU  - Inkson BJ

AU  - Rodenburg C

ED  - 

DO  - DOI: 10.1017/S1431927609090400

VL  - 15

IS  - 3

SP  - 237

EP  - 243

Y2  - 2024/12/21

ER  -