TY  - JOUR

T1  - How to best measure atomic segregation to grain boundaries by analytical transmission electron microscopy

JO  - Journal of Materials Science

UR  - http://eprints.whiterose.ac.uk/86358/

PY  - 2014/06/01

AU  - Walther T

AU  - Hopkinson M

AU  - Daneu N

AU  - Recnik A

AU  - Ohno Y

AU  - Inoue K

AU  - Yonenaga I

ED  - 

DO  - DOI: 10.1007/s10853-013-7932-2

VL  - 49

IS  - 11

SP  - 3898

EP  - 3908

Y2  - 2024/12/20

ER  -