TY  - JOUR

T1  - Evaluation and identification of potential high-value patents in the field of integrated circuits using a multidimensional patent indicators pre-screening strategy and machine learning approaches

JO  - Journal of Informetrics

UR  - http://dx.doi.org/10.1016/j.joi.2023.101406

PY  - 2023/05/01

AU  - Hu Z

AU  - Zhou X

AU  - Lin A

ED  - 

DO  - DOI: 10.1016/j.joi.2023.101406

PB  - Elsevier BV

VL  - 17

IS  - 2

SP  - 101406

EP  - 101406

Y2  - 2025/03/11

ER  -