TY  - JOUR

T1  - Development of a new analytical electron microscopy technique to quantify the chemistry of planar defects and to measure accurately solute segregation to grain boundaries

JO  - Journal of Microscopy

PY  - 2004/01/01

AU  - Walther T

ED  - 

DO  - DOI: 10.1111/j.0022-2720.2004.01359.x

VL  - 215

IS  - 2

SP  - 191

EP  - 202

Y2  - 2024/10/23

ER  -