TY  - CONF

T1  - Structural analysis of the effects of a combined InAlAs-InGaAs capping layer in 1.3-mu m InAs quantum dots

JO  - Microscopy of Semiconducting Materials

PY  - 2005/01/01

AU  - Tey CM

AU  - Cullis AG

AU  - Liu HY

AU  - Ross IM

AU  - Hopkinson M

ED  - Cullis AG

ED  - Hutchison JL

VL  - 107

SP  - 263

EP  - 266

Y2  - 2024/12/22

ER  -