@article{article, title  = {{Lattice resolved annular dark-field scannning transmission electron microscopy of (Al,Ga)GaN/GaN layers for measuring segregation with sub-monolayer precision}},

 url = {{}},

 year = {{2013}},

 month = {{1}},

 author = {{Walther T and Amari H and Ross IM and Wang T and Cullis AG}},

 doi = {{10.1007/s10853-012-6822-3}},

 volume = {{48}},

 journal = {{Journal of Materials Science}},

 pages = {{2883-2892}},

 note = {{Accessed on 2024/10/23}}}