TY  - JOUR

T1  - Lattice resolved annular dark-field scannning transmission electron microscopy of (Al,Ga)GaN/GaN layers for measuring segregation with sub-monolayer precision

JO  - Journal of Materials Science

PY  - 2013/01/01

AU  - Walther T

AU  - Amari H

AU  - Ross IM

AU  - Wang T

AU  - Cullis AG

ED  - 

DO  - DOI: 10.1007/s10853-012-6822-3

VL  - 48

SP  - 2883

EP  - 2892

Y2  - 2024/10/23

ER  -