TY  - JOUR

T1  - Atomic-resolution STEM imaging and EELS-SI of defects in BiFeO<inf>3</inf> ceramics co-doped with Nd and Ti

JO  - Journal of Physics: Conference Series

PY  - 2012/01/01

AU  - Wang LQ

AU  - Schaffer B

AU  - MacLaren I

AU  - Miao S

AU  - Craven AJ

AU  - Reaney IM

ED  - 

DO  - DOI: 10.1088/1742-6596/371/1/012034

VL  - 371

Y2  - 2024/10/23

ER  -