TY  - CONF

T1  - Determining Buried Wetting Layer Thicknesses to Sub-Monolayer Precision by Linear Regression Analysis of Series of Spectra

JO  - MICROSCOPY OF SEMICONDUCTING MATERIALS 2007

PY  - 2008/01/01

AU  - Walther T

ED  - Cullis AG

ED  - Midgley PA

VL  - 120

SP  - 247

EP  - 250

Y2  - 2024/10/23

ER  -