@inproceedings{inproceedings, title  = {{Failure analysis studies in pseudomorphic SiGe channel p-MOSFET devices}},

 url = {{}},

 year = {{2005}},

 month = {{1}},

 author = {{Chang ACK and Ross IM and Norris DJ and Cullis AG and T Tang Y and Cerrina C and Evans AGR}},

 volume = {{107}},

 journal = {{Microscopy of Semiconducting Materials}},

 pages = {{413-416}},

 note = {{Accessed on 2024/12/21}}}