TY  - JOUR

T1  - Characterisation of series resistance degradation through charge pumping technique

JO  - MICROELECTRONICS RELIABILITY

PY  - 2003/04/01

AU  - Manhas SK

AU  - Sehkar DC

AU  - Oates AS

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1016/S0026-2714(03)00017-9

VL  - 43

IS  - 4

SP  - 617

EP  - 624

Y2  - 2024/12/20

ER  -