TY  - JOUR

T1  - Electromagnetic-thermal coupled fault analysis of PMASynRM with turn-to-turn short circuit involving a few strands

JO  - IEEE Transactions on Industry Applications

PY  - 2021/01/01

AU  - Shi Y

AU  - Wang J

AU  - Wang B

ED  - 

DO  - DOI: 10.1109/tia.2021.3127856

PB  - Institute of Electrical and Electronics Engineers (IEEE)

SP  - 1

EP  - 1

Y2  - 2024/12/22

ER  -