TY  - CONF

T1  - On the Dynamic characteristics of Ferroelectric and Paraelectric FETs

JO  - 2018 IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2018 - Proceedings

UR  - http://eprints.whiterose.ac.uk/129129/

PY  - 2018/03/12

AU  - Kumar A

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1109/EDTM.2018.8421493

SN  - 9781538637111

SP  - 184

EP  - 186

Y2  - 2024/12/20

ER  -