TY  - CONF

T1  - New methods for the quantitative chemical study of planar defects and interfaces by transmission electron microscopy

CY  - Ljubljana

PY  - 2005/06/01

AU  - Walther T

AU  - Daneu N

AU  - Recnik A

ED  - Ceh M

ED  - Drazic G

ED  - Fidler S

PB  - Slovene Socitey for Microscopy and Department for Nanostrcutured Materials, Jozef Stefan Institute

SP  - 75

EP  - 78

Y2  - 2024/12/20

ER  -