TY  - CONF

T1  - Energy Filtered Scanning Electron Microscopy: applications to characterisation of semiconductors

JO  - ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009)

PY  - 2010/01/01

AU  - Rodenburg C

AU  - Jepson MAE

AU  - Inkson BJ

AU  - Bosch EGT

AU  - Humphreys CJ

ED  - Baker RT

DO  - DOI: 10.1088/1742-6596/241/1/012074

VL  - 241

Y2  - 2024/12/21

ER  -