@article{article, title  = {{Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping.}},

 url = {{}},

 year = {{2010}},

 month = {{4}},

 author = {{Rodenburg C and Jepson MAE and Bosch EGT and Dapor M}},

 doi = {{10.1016/j.ultramic.2010.04.008}},

 volume = {{110}},

 journal = {{Ultramicroscopy}},

 issue = {{9}},

 pages = {{1185-1191}},

 note = {{Accessed on 2024/12/21}}}