TY  - CONF

T1  - Comparison of the contrast in conventional and lattice resolved ADF STEM images of InGaAs/GaAs structures using different camera lengths

JO  - 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011

PY  - 2011/01/01

AU  - Qiu Y

AU  - Lari L

AU  - Ross IM

AU  - Walther T

AU  - IOP

ED  - 

DO  - DOI: 10.1088/1742-6596/326/1/012041

VL  - 326

Y2  - 2024/10/23

ER  -