TY  - JOUR

T1  - Linear least-squares fit evaluation of series of analytical spectra from planar defects: Extension and possible implementations in scanning transmission electron microscopy

JO  - Journal of Microscopy

PY  - 2006/01/01

AU  - Walther T

ED  - 

DO  - DOI: 10.1111/j.1365-2818.2006.01608.x

VL  - 223

IS  - 2

SP  - 165

EP  - 170

Y2  - 2024/10/23

ER  -