TY  - CONF

T1  - The limitations of pattern recognition and displacement measurement techniques for evaluating HREM images of strained semiconductor interfaces

JO  - ELECTRON MICROSCOPY AND ANALYSIS 1995

PY  - 1995/01/01

AU  - Walther T

AU  - Humphreys CJ

ED  - Cherns D

VL  - 147

SP  - 103

EP  - 106

Y2  - 2024/10/23

ER  -