TY  - JOUR

T1  - Automated background subtraction technique for electron energy‐loss spectroscopy and application to semiconductor heterostructures

JO  - Journal of Microscopy

UR  - http://eprints.whiterose.ac.uk/107202/

PY  - 2016/04/14

AU  - Angadi VC

AU  - Abhayaratne C

AU  - Walther T

ED  - 

DO  - DOI: 10.1111/jmi.12397

VL  - 262

IS  - 2

SP  - 157

EP  - 166

Y2  - 2024/12/20

ER  -