TY  - JOUR

T1  - Helium ion microscopy and energy selective scanning electron microscopy-two advanced microscopy techniques with complementary applications

JO  - Journal of Physics: Conference Series

PY  - 2014/01/01

AU  - Rodenburg C

AU  - Jepson MAE

AU  - Boden SA

AU  - Bagnall DM

ED  - 

DO  - DOI: 10.1088/1742-6596/522/1/012049

VL  - 522

IS  - 1

Y2  - 2024/12/21

ER  -