@article{article, title  = {{Bounded Reordering in the Distributed Test Architecture}},

 publisher = {{Institute of Electrical and Electronics Engineers (IEEE)}},

 url = {{http://eprints.whiterose.ac.uk/142295/ }},

 year = {{2018}},

 month = {{6}},

 author = {{Hierons RM and Merayo MG and Nunez M}},

 doi = {{10.1109/tr.2018.2800093}},

 volume = {{67}},

 journal = {{IEEE Transactions on Reliability}},

 issue = {{2}},

 pages = {{522-537}},

 note = {{Accessed on 2024/12/21}}}