TY  - JOUR

T1  - Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging

JO  - Advanced Materials

UR  - http://eprints.whiterose.ac.uk/122497/

PY  - 2017/12/14

AU  - Wan Q

AU  - Abrams K

AU  - Masters R

AU  - Talari

AU  - Rehman

AU  - Claeyssens

AU  - Holland C

AU  - Rodenburg C

ED  - 

DO  - DOI: 10.1002/adma.201703510

PB  - Wiley

VL  - 29

IS  - 47

Y2  - 2024/12/21

ER  -