@inproceedings{inproceedings, title  = {{The effect of dielectric stress on the electrical characteristics of AlGaN/GaN heterostructure field-effect transistors (HFETs)}},

 url = {{}},

 year = {{2002}},

 month = {{1}},

 author = {{Tan WS and Hill G and Houston PA and Low MW and Parbrook PJ and Airey RJ}},

 journal = {{EDMO 2002: 10TH IEEE INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS}},

 pages = {{130-135}},

 note = {{Accessed on 2024/12/20}}}