@inproceedings{inproceedings, title  = {{Edge effect under temperature bias stress of 0.18 mu m PMOS technology}},

 url = {{}},

 year = {{2004}},

 month = {{1}},

 author = {{Sekhar DC and Ray PP and De Souza MM and Chaparala P and ieee}},

 journal = {{2004 24TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, PROCEEDINGS, VOLS 1 AND 2}},

 pages = {{645-648}},

 note = {{Accessed on 2024/12/20}}}