TY - CONF T1 - Characterization of InGaAs (N)/GaAsN multi-quantum wells using transmission electron microscopy JO - MICROSCOPY OF SEMICONDUCTING MATERIALS 2003 PY - 2018/01/01 AU - Gutierrez M AU - Herrera M AU - Ross I AU - Gonzalez D AU - Hopkinson M AU - Garcia R ED - Cullis AG ED - Midgley PA IS - 180 SP - 143 EP - 146 Y2 - 2024/12/22 ER -