TY  - CONF

T1  - Automatic Test Data Generation for Multiple Condition and MCDC Coverage

JO  - 2009 Fourth International Conference on Software Engineering Advances

PY  - 2009/01/01

AU  - Ghani K

AU  - Clark JA

ED  - 

DO  - DOI: 10.1109/icsea.2009.31

PB  - IEEE

SN  - 9781424447794

Y2  - 2024/12/22

ER  -