TY  - JOUR

T1  - Quantitative characterization of AlAs/GaAs interfaces by high-resolution transmission electron microscopy along the 〈100〉 and the 〈110〉 projection

JO  - Applied Physics A Solids and Surfaces

PY  - 1993/01/01

AU  - Walther T

AU  - Gerthsen D

ED  - 

DO  - DOI: 10.1007/BF00331777

VL  - 57

IS  - 5

SP  - 393

EP  - 400

Y2  - 2024/10/23

ER  -