TY  - JOUR

T1  - Analysis of CMOS-compatible lateral insulated base transistors

JO  - IEEE Transactions on Electron Devices

PY  - 1991/01/01

AU  - Narayanan EMS

AU  - Amaratunga GAJ

AU  - Milne WI

AU  - Humphrey JI

AU  - Huang Q

ED  - 

DO  - DOI: 10.1109/16.85159

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 38

IS  - 7

SP  - 1624

EP  - 1632

Y2  - 2024/12/20

ER  -