TY  - CONF

T1  - Comparison of multilayered nanowire imaging by SEM and Helium Ion Microscopy

JO  - ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009)

PY  - 2010/01/01

AU  - Inkson BJ

AU  - Liu X

AU  - Peng Y

AU  - Jepson MAE

AU  - Rodenburg C

ED  - Baker RT

DO  - DOI: 10.1088/1742-6596/241/1/012080

VL  - 241

Y2  - 2024/12/21

ER  -