@article{article, title  = {{Metal-Induced Trap States: The Roles of Interface and Border Traps in HfO2/InGaAs}},

 publisher = {{MDPI AG}},

 url = {{http://dx.doi.org/10.3390/mi14081606 }},

 year = {{2023}},

 month = {{8}},

 author = {{Do H-B and Luc Q-H and Pham PV and Phan-Gia A-V and Nguyen T-S and Le H-M and De Souza MM}},

 doi = {{10.3390/mi14081606}},

 volume = {{14}},

 journal = {{Micromachines}},

 issue = {{8}},

 pages = {{1606-1606}},

 note = {{Accessed on 2024/12/20}}}