@inproceedings{inproceedings, title  = {{Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope}},

 publisher = {{IOP Publishing}},

 url = {{https://eprints.whiterose.ac.uk/164366/ }},

 year = {{2020}},

 month = {{8}},

 author = {{Trager-Cowan C and Alasmari A and Avis W and Bruckbauer J and Edwards PR and Hourahine B and Kraeusel S and Kusch G and Jablon BM and Johnston R and Martin RW et al}},

 doi = {{10.1088/1757-899x/891/1/012023}},

 volume = {{891}},

 journal = {{IOP Conference Series: Materials Science and Engineering}},

 note = {{Accessed on 2024/12/21}}}