TY  - CHAP

T1  - Automated EELS Core-Loss Edge Detection for Quantification of the Chemical Composition of Nano-Structured Semiconductors

T2  - Encyclopedia of Materials: Electronics

PY  - 2023/01/01

AU  - Angadi VC

AU  - Abhayaratne C

AU  - Walther T

ED  - 

DO  - DOI: 10.1016/B978-0-12-819728-8.00007-3

SN  - 9780128197288

VL  - 1-3

SP  - V3

EP  - 605

Y2  - 2024/10/23

ER  -