TY  - JOUR

T1  - Advantages of Energy Selective Secondary Electron Detection in SEM

JO  - Microscopy and Microanalysis

PY  - 2010/07/05

AU  - Rodenburg C

AU  - Jepson MAE

AU  - Bosch E

ED  - 

DO  - DOI: 10.1017/s1431927610053754

PB  - Cambridge University Press (CUP)

VL  - 16

IS  - S2

SP  - 622

EP  - 623

Y2  - 2024/12/21

ER  -