TY  - CONF

T1  - Measuring grain boundary segregation: tomographic atom probe field ion microscopy (APFIM) vs. analytical scanning transmission electron microscopy (STEM)

JO  - Journal of Physics: Conference Series

UR  - http://eprints.whiterose.ac.uk/146747/

PY  - 2019/05/23

AU  - Walther T

ED  - 

DO  - DOI: 10.1088/1742-6596/1190/1/012002

PB  - IOP Publishing

VL  - 1190

IS  - 1

Y2  - 2024/10/23

ER  -