TY  - JOUR

T1  - 3D metrology of nanoparticles by tomogram processing

JO  - Microscopy and Microanalysis

PY  - 2008/01/01

AU  - Xu XJ

AU  - Saghi Z

AU  - Möbus G

ED  - 

DO  - DOI: 10.1017/S1431927608085693

VL  - 14

IS  - SUPPL. 2

SP  - 592

EP  - 593

Y2  - 2024/12/22

ER  -