TY  - JOUR

T1  - Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures

JO  - Crystals

UR  - https://doi.org/10.3390/cryst15020192

PY  - 2025/02/17

AU  - Gong T

AU  - Chen L

AU  - Wang X

AU  - Qiu Y

AU  - Liu H

AU  - Yang Z

AU  - Walther T

ED  - 

DO  - DOI: 10.3390/cryst15020192

PB  - MDPI AG

VL  - 15

IS  - 2

SP  - 192

EP  - 192

Y2  - 2025/03/10

ER  -