TY  - JOUR

T1  - Comparative study of drift region designs in RF LDMOSFETs

JO  - IEEE Transactions on Electron Devices

PY  - 2004/01/01

AU  - Cao G

AU  - Manhas SK

AU  - Narayanan EMS

AU  - De Souza MM

AU  - Hinchley D

ED  - 

DO  - DOI: 10.1109/TED.2004.832703

VL  - 51

IS  - 8

SP  - 1296

EP  - 1303

Y2  - 2024/12/20

ER  -