TY  - CONF

T1  - Analysis of partially oxidised epitaxial silicon mono-layers on germanium virtual substrates using aberration corrected scanning transmission electron microscopy

JO  - 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011

PY  - 2011/01/01

AU  - Ross IM

AU  - Norris DJ

AU  - De Jaeger B

AU  - Lee W

AU  - Meuris M

AU  - Walther T

AU  - IOP

ED  - 

DO  - DOI: 10.1088/1742-6596/326/1/012050

VL  - 326

Y2  - 2024/12/20

ER  -