Professor John David
PhD, BEng
School of Electrical and Electronic Engineering
Personal Chair
Departmental Director of Admissions
Semiconductor Materials and Devices Research Group
+44 114 222 5185
Full contact details
School of Electrical and Electronic Engineering
- Profile
-
I obtained my BEng and PhD degrees in Electronic Engineering from the University of 葫芦影业 in 1979 and 1983, respectively.
After that, I undertook a number of postdoctoral positions within the Department of Electronic & Electrical Engineering at 葫芦影业 eventually managing the characterisation activities of the SERC Centre for III鈥揤 Semiconductors.
In 2001 I left to join Marconi Optical Components, Caswell before returning the following year as a Senior Lecturer.
In 2004 I became Professor of Semiconductor Materials and Devices, and between 2009 to 2013 served as Head of Department. Between 2002 -2004 I was a IEEE LEOS Distinguished Lecturer and I am currently a Fellow of the IEEE and IET.
My research is focussed in two areas;
- on the characterisation of III-V semiconductor materials and devices, especially that containing Bismuth and
- on the understanding and development of avalanche photodiodes. The addition to Bismuth offers a possible route to extend the wavelength of many optical structures such as photodiodes and solar cells.
I use characterisation techniques such as X-ray double crystal diffraction and photoluminescence to study semiconductor structures containing bulk and quantum wells of GaAsBi and , and then correlate this to current-voltage, capacitance-voltage and photocurrent spectra of fabricated devices.
I also study how under very high electric-fields, electrons and holes in a semiconductor gain energy and create further carriers through a process of impact ionisation. This process can lead to destructive breakdown in power electronic devices but can also be utilised to amplify weak optical signals, giving rise to avalanche photodiodes (APDs).
I study the theory behind the ionisation process via different modelling techniques and also look experimentally at the ionisation coefficients in different semiconductor materials and device structures.
The aim of my research is to develop APDs capable of operating at very high speeds for next generation telecommunication networks and also APDs that are very sensitive.
- Qualifications
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- PhD (Semiconductors), University of 葫芦影业 1983
- BEng (Electronics), University of 葫芦影业 1976
- Research interests
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- Impact Ionisation and breakdown in semiconductors
- Photodiode and avalanche photodiodes
- Bismuth containing alloys
- Publications
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Journal articles
- . Applied Physics Letters, 125(22).
- . Applied Physics Letters, 124(25).
- . Optics Express, 32(11), 19449-19449.
- . Applied Physics Letters, 123(13).
- . Optics Express, 31(20), 33141-33141.
- . Applied Physics A, 129(8).
- . Sci Rep, 13(1), 9936.
- . Applied Physics Letters, 122(22).
- . Journal of Materials Science: Materials in Electronics, 34(6).
- . Optica, 10(2).
- . Journal of Lightwave Technology, 1-11.
- . Materials Science in Semiconductor Processing, 153, 107135-107135.
- . Journal of Lightwave Technology, 1-11.
- . Journal of Crystal Growth, 589.
- . Journal of Nanomaterials, 2022.
- . Journal of Physics D: Applied Physics, 55(6), 065105-065105.
- . Scientific Reports, 12.
- . Journal of Lightwave Technology.
- . Nature Communications, 12(1).
- . Scientific Reports, 11(1).
- . IEEE Journal of Quantum Electronics, PP(99), 1-1.
- . IEEE Transactions on Electron Devices, 1-6.
- . IEEE Journal of Selected Topics in Quantum Electronics, 1-1.
- . Sains Malaysiana, 49(10), 2559-2564.
- . Semiconductor Science and Technology.
- . Applied Surface Science, 485, 29-34.
- . Nature Photonics.
- . Journal of Lightwave Technology, 37(13), 3315-3323.
- . Semiconductor Science and Technology, 33(9).
- . Scientific Reports, 8(1).
- . Measurement Science and Technology, 29(6), 065015-065015.
- . Scientific Reports, 8(1).
- . IEEE Journal of Selected Topics in Quantum Electronics, 24(2), 1-3.
- . Physical Communication, 31, 160-168.
- . Solar Energy Materials and Solar Cells, 172, 238-243.
- . Journal of Lightwave Technology, 35(11), 2315-2324.
- . Solar Energy Materials and Solar Cells, 164, 28-31.
- . Nano Advances.
- . Optics Express, 24(19), 21597-21608.
- . IEEE Photonics Technology Letters, 28(22), 2495-2498.
- . Journal of Physics D: Applied Physics, 49(35).
- . Nature Photonics, 10(6), 364-366.
- . Journal of Instrumentation, 11(3).
- . Journal of Lightwave Technology, 34(11), 2639-2644.
- . IEEE Photonics Technology Letters, 28(4), 481-484.
- . Journal of Physics D: Applied Physics, 48(40), 405101-405101.
- . Semiconductor Science and Technology, 30(9), 094010-094010.
- . IEEE Transactions on Electron Devices, 62(9), 2928-2932.
- . Semiconductor Science and Technology, 30(9), 094018-094018.
- . Semiconductor Science and Technology, 30(9), 094005-094005.
- . Semiconductor Science and Technology, 30(9), 094013-094013.
- . Semiconductor Science and Technology, 30(9), 094004-094004.
- . Journal of Crystal Growth, 425, 237-240.
- . IEEE Transactions on Electron Devices, 62(6), 1946-1952.
- . IEEE Transactions on Instrumentation and Measurement, 64(2), 502-508.
- . Journal of Applied Physics, 116(23), 233508-233508.
- . Optics Express, 22(19), 22608-22615.
- . Journal of Lightwave Technology, 32(14), 2582-2592.
- . Physica Status Solidi (B) Basic Research, 251(6), 1276-1281.
- . Applied Physics Letters, 104(17).
- . IEEE Journal of Selected Topics in Quantum Electronics, 20(6).
- . Journal of Instrumentation, 9.
- . Journal of Crystal Growth, 390, 120-124.
- . IEEE Transactions on Electron Devices, 61(3), 838-843.
- . JOURNAL OF APPLIED PHYSICS, 115(6).
- . IEEE PHOTONICS JOURNAL, 6(1).
- . Nanoscale Research Letters, 9(1), 1-8.
- . APPLIED PHYSICS EXPRESS, 6(11).
- . Applied Physics Letters, 103(10).
- . Semiconductor Science and Technology, 28(9).
- . APPLIED PHYSICS EXPRESS, 6(4).
- . Conference Record of the IEEE Photovoltaic Specialists Conference, 303-305.
- . Optics Express, 20(28), 29568-29576.
- . Measurement Science and Technology, 23(12).
- . IEEE Transactions on Electron Devices, 59(4), 1030-1036.
- . IEEE Transactions on Electron Devices, 59(4), 1063-1067.
- . Proceedings of SPIE - The International Society for Optical Engineering, 8541.
- . IEEE Photonics Technology Letters, 24(23), 2191-2194.
- . Journal of Electronic Materials, 1-9.
- . Applied Physics Letters, 101(1).
- . IEEE Transactions on Circuits and Systems.
- . Optics Express, 20(10), 10446-10452.
- . Journal of Physics: Conference Series, 356(1).
- Impact Ionization Coefficients in 4H-SiC by Ultralow Excess Noise Measurement. IEEE Transactions on Electron Devices.
- . Journal of Crystal Growth, 341(1), 19-23.
- . Physica Status Solidi (C) Current Topics in Solid State Physics, 9(2), 259-261.
- . IEEE Photonics Technology Letters, 24(3), 218-220.
- Bi incorporation in GaAs(100)-2脳1 and 4脳3 reconstructions investigated by RHEED and STM. Journal of Crystal Growth.
- . Physica Status Solidi (C) Current Topics in Solid State Physics, 9(2), 310-313.
- Non-stoichiometric GaAsBi/GaAs (100) molecular beam epitaxy growth. Journal of Crystal Growth.
- . Opt Express, 19(23), 23341-23349.
- . IEEE J QUANTUM ELECT, 47(8), 1123-1128.
- . APPL PHYS LETT, 99(4).
- . IEEE ELECTR DEVICE L, 32(7), 919-921.
- . J APPL PHYS, 109(11).
- . IEEE T ELECTRON DEV, 58(6), 1696-1701.
- . IEEE J QUANTUM ELECT, 47(6), 858-864.
- . IEEE J QUANTUM ELECT, 47(5), 607-613.
- . APPL PHYS LETT, 98(12).
- . Journal of Instrumentation, 6(12).
- . Journal of Instrumentation, 6(12).
- . 2011 IEEE Regional Symposium on Micro and Nanoelectronics, RSM 2011 - Programme and Abstracts, 32-35.
- Impact Ionization Coefficients in Al0.52In0.48P. IEEE Electron Device Letters.
- . IEEE Electron Device Letters, 32(11), 1528-1530.
- . AIP Conference Proceedings, 1328, 136-138.
- . Infrared Physics and Technology, 54(3), 228-232.
- . IEEE Transactions on Electron Devices, 58(2), 486-489.
- . IEEE Photonics Technology Letters, 23(4), 233-235.
- . IEEE Transactions on Electron Devices, 58(1), 103-106.
- . IEEE Journal of Quantum Electronics, 47(2), 190-197.
- . NUCL INSTRUM METH A, 621(1-3), 453-455.
- . IEEE J QUANTUM ELECT, 46(8), 1153-1157.
- . IEEE Journal of Quantum Electronics, 46(12), 1847-1853.
- . IEEE Transactions on Electron Devices, 57(10), 2631-2638.
- . Journal of Physics D: Applied Physics, 43(24).
- . J LIGHTWAVE TECHNOL, 27(15), 3294-3302.
- . J APPL PHYS, 106(2).
- . IEEE PHOTONIC TECH L, 21(13), 866-868.
- . IEEE J QUANTUM ELECT, 45(5-6), 566-571.
- . IEEE J QUANTUM ELECT, 45(1-2), 79-85.
- . Materials Research Society Symposium Proceedings, 1069, 245-250.
- . APPL PHYS LETT, 93(11).
- . NUCL INSTRUM METH A, 594(2), 202-205.
- . IEEE T ELECTRON DEV, 55(8), 1984-1990.
- . IEEE J SEL TOP QUANT, 14(4), 998-1009.
- . J APPL PHYS, 104(1).
- . IEEE J QUANTUM ELECT, 44(3-4), 378-382.
- . Journal of Applied Physics, 104(12).
- . IET OPTOELECTRONICS, 1(6), 249-254.
- . IEEE T COMMUN, 55(11), 2152-2158.
- . J PHYS D APPL PHYS, 40(18), 5537-5540.
- . IEEE T ELECTRON DEV, 54(8), 2051-2054.
- . IEEE J SEL TOP QUANT, 13(4), 919-925.
- . IEEE J SEL TOP QUANT, 13(4), 906-910.
- . IEEE J QUANTUM ELECT, 43(5-6), 503-507.
- . J APPL PHYS, 101(6).
- . SEMICOND SCI TECH, 22(3), 245-248.
- . J MOD OPTIC, 54(2-3), 353-360.
- Effects of Ionization Velocity and Dead Space on Avalanche Photodiode Bit Error Rate.. IEEE Trans. Communications, 55, 2033-2033.
- . IEEE T ELECTRON DEV, 54(1), 11-16.
- . Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, 859-860.
- . MICROELECTRONICS JOURNAL, 37(12), 1468-1470.
- . MEAS SCI TECHNOL, 17(7), 1941-1946.
- . IEEE J QUANTUM ELECT, 42(3-4), 397-403.
- . J APPL PHYS, 99(4).
- . J APPL PHYS, 99(2).
- . IEEE Transactions on Electron Devices, 53(9), 2328-2334.
- . IEEE PHOTONIC TECH L, 17(11), 2412-2414.
- . IEEE J QUANTUM ELECT, 41(8), 1092-1096.
- . IEEE T ELECTRON DEV, 52(7), 1527-1534.
- . J APPL PHYS, 97(8).
- . APPL PHYS LETT, 86(6).
- . Proceedings of ESSDERC 2005: 35th European Solid-State Device Research Conference, 2005, 245-248.
- . Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, 2005, 369-370.
- . IEEE J QUANTUM ELECT, 41(1), 70-75.
- . Extended Abstracts of the 2004 International Conference on Solid State Devices and Materials.
- . J APPL PHYS, 96(4), 1988-1992.
- . APPL PHYS LETT, 85(5), 704-706.
- . J APPL PHYS, 95(10), 5931-5933.
- . APPL PHYS LETT, 84(13), 2322-2324.
- . Journal of Applied Physics, 96(9), 5017-5019.
- Establishing MOVPE growth of InAs/GaAs quantum dots in a commercial 8脳3鈥 multiwafer reactor for optoelectronic applications. Design and Nature, 6, 107-110.
- . Journal of Applied Physics, 95(11 I), 6245-6251.
- . Journal of Applied Physics, 95(7), 3561-3564.
- . Proceedings of SPIE - The International Society for Optical Engineering, 5451, 426-433.
- Gain dependent avalanche duration and gain脳bandwidth product in an avalanche photodiode. Proceedings of the 4th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD '04, 30-31.
- . APPL PHYS LETT, 83(24), 4951-4953.
- . APPL PHYS LETT, 83(14), 2820-2822.
- . IEEE T ELECTRON DEV, 50(10), 2021-2026.
- . J APPL PHYS, 94(4), 2631-2637.
- . IEEE T ELECTRON DEV, 50(8), 1724-1732.
- The effect of dead space on gain and excess noise in In0.48Ga0.52P p(+)in(+) diodes. SEMICOND SCI TECH, 18(8), 803-806.
- . IEEE T ELECTRON DEV, 50(4), 901-905.
- . IEE PROCEEDINGS-OPTOELECTRONICS, 150(2), 187-190.
- . APPL PHYS LETT, 82(8), 1224-1226.
- Demonstration of 4H-SiC avalanche photodiodes linear array. SOLID-STATE ELECTRONICS, 47(2), 241-245.
- Low Noise Avalanche Photodiodes. Conference on Optical Fiber Communication, Technical Digest Series, 86, 336-337.
- Effect of temperature on the avalanche properties of sub-micron structures. Institute of Physics Conference Series, 174, 263-266.
- . Semiconductor Science and Technology, 18(7), 689-692.
- . Proceedings of SPIE - The International Society for Optical Engineering, 4999, 349-362.
- . IEEE Transactions on Electron Devices, 50(10), 2027-2031.
- . IEE Proceedings: Optoelectronics, 150(2), 167-170.
- . IEEE Transactions on Electron Devices, 50(2), 347-351.
- . Journal of Applied Physics, 93(7), 4232-4239.
- . J LIGHTWAVE TECHNOL, 21(1), 155-159.
- . J APPL PHYS, 92(12), 7684-7686.
- . IEEE T ELECTRON DEV, 49(12), 2349-2351.
- A general method for estimating the duration of avalanche multiplication. SEMICOND SCI TECH, 17(10), 1067-1071.
- . IEEE PHOTONIC TECH L, 14(9), 1342-1344.
- . J APPL PHYS, 91(8), 5200-5202.
- Effect of dead space on avalanche speed. IEEE T ELECTRON DEV, 49(4), 544-549.
- Excess noise characteristics of Al0.8Ga0.2As avalanche photodiodes. IEEE PHOTONIC TECH L, 14(4), 522-524.
- . ELECTRON LETT, 38(7), 335-336.
- Measurement of electron saturation velocity in Ga0.52In0.48P in a double heterojunction bipolar transistor. J APPL PHYS, 91(3), 1601-1605.
- . Journal of Applied Physics, 91(8), 5438-5441.
- Non-equilibrium modelling of avalanche photodiode speed. Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, 2, 490-491.
- . Journal of Applied Physics, 91(3), 2107-2111.
- . IEE P-OPTOELECTRON, 148(5-6), 243-246.
- Avalanche multiplication characteristics of Al0.8Ga0.2As diodes. IEEE T ELECTRON DEV, 48(10), 2198-2204.
- Treatment of soft threshold in impact ionization. J APPL PHYS, 90(5), 2538-2543.
- Fokker-Planck model for nonlocal impact ionization in semiconductors. J APPL PHYS, 90(3), 1314-1317.
- Low multiplication noise thin Al0.6Ga0.4As avalanche photodiodes. IEEE T ELECTRON DEV, 48(7), 1310-1317.
- GaN Schottky ultraviolet photodetectors using the metal-semiconductor-metal structure. Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO, 131-136.
- Low noise avalanche photodiodes. Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS, 2, 693-694.
- . Journal of Applied Physics, 89(5), 2742-2751.
- Impact ionization coefficients of Al0.8Ga0.2As. APPL PHYS LETT, 77(26), 4374-4376.
- Avalanche multiplication in submicron AlxGa1-xAs/GaAs multilayer structures. J APPL PHYS, 88(5), 2601-2608.
- Avalanche noise measurement in thin Si p(+)-i-n(+) diodes. APPL PHYS LETT, 76(26), 3926-3928.
- Avalanche noise characteristics of thin GaAs structures with distributed carrier generation. IEEE T ELECTRON DEV, 47(5), 910-914.
- . Phys Rev Lett, 84(4), 733-736.
- . Semiconductor Science and Technology, 15(7), 692-699.
- . Journal of Applied Physics, 87(11), 7885-7891.
- . IEEE Transactions on Electron Devices, 47(5), 1080-1088.
- . IEEE Transactions on Electron Devices, 47(5), 1089-1097.
- The effect of an electric-field gradient on avalanche noise. APPL PHYS LETT, 75(19), 2963-2965.
- Low avalanche noise characteristics in thin InP p(+)-i-n(+) diodes with electron initiated multiplication. IEEE PHOTONIC TECH L, 11(3), 364-366.
- Low noise GaAs and Al0.3Ga0.7As avalanche photodetectors. IEE P-OPTOELECTRON, 146(1), 21-24.
- . Proceedings of SPIE - The International Society for Optical Engineering, 3896, 163-170.
- . Semiconductor Science and Technology, 14(11), 994-1000.
- . IEE Proceedings: Optoelectronics, 146(1), 62-66.
- . Electronics Letters, 35(2), 150-152.
- . IEEE Transactions on Electron Devices, 46(4), 769-775.
- . Applied Physics Letters, 75(13), 1929-1931.
- Avalanche multiplication and breakdown in Ga0.52In0.48P diodes. IEEE T ELECTRON DEV, 45(10), 2096-2101.
- Avalanche multiplication noise characteristics in thin GaAs p(+)-i-n(+) diodes. IEEE T ELECTRON DEV, 45(10), 2102-2107.
- Avalanche multiplication in GaInP/GaAs single heterojunction bipolar transistors. IEEE T ELECTRON DEV, 45(6), 1207-1212.
- Low excess noise characteristics in thin avalanche region GaAs diodes. ELECTRON LETT, 34(1), 125-126.
- . Applied Physics Letters, 72(2), 232-234.
- . IEEE Transactions on Electron Devices, 45(8), 1804-1810.
- . Journal of Crystal Growth, 195(1-4), 668-675.
- InGaAs/GaAs piezoelectric lasers. Conference on Lasers and Electro-Optics Europe - Technical Digest, 95.
- . Journal of Applied Physics, 83(6), 3426-3428.
- . Journal of Applied Physics, 84(8), 4363-4369.
- Electrical and optical characterisation of heavily doped GaAs : C bases of heterojunction bipolar transistors. SOLID STATE ELECTRON, 42(1), 115-120.
- Effects of high temperature annealing on the device characteristics of Ga0.52In0.48P/GaAs and Al0.52In0.48P/GaAs heterojunction bipolar transistors. J ELECTRON MATER, 27(1), 17-23.
- Mapping the confined optical field in a microcavity via the emission from a conjugated polymer. APPL PHYS LETT, 71(6), 744-746.
- Impact ionization coefficients in GaInP p-i-n diodes. APPL PHYS LETT, 70(26), 3567-3569.
- Electrical and optical bistability in InxGa1-xAs-GaAs piezoelectric quantum wells. PHYS REV B, 55(24), 16045-16048.
- . Microelectronics Journal, 28(8-10), 757-765.
- . Semiconductor Science and Technology, 12(9), 1147-1153.
- . Semiconductor Science and Technology, 12(6), 692-697.
- . IEEE Transactions on Electron Devices, 44(4), 659-663.
- . Electronics Letters, 33(11), 957-958.
- . Electronics Letters, 33(4), 337-339.
- . IEEE Photonics Technology Letters, 9(2), 143-145.
- . Journal of Crystal Growth, 170(1-4), 399-403.
- . Electronics Letters, 33(7), 639-640.
- . Journal of Crystal Growth, 170(1-4), 394-398.
x Ga1-x )0.52 In0.48 P p-i-n diodes. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE, 256-260.
Breakdown characteristics of (Al- . Journal of Crystal Growth, 170(1-4), 621-625.
- . Semiconductor Science and Technology, 12(1), 111-120.
- . Applied Physics Letters, 71(26), 3877-3879.
- . Journal of Applied Physics, 82(3), 1231-1235.
- Investigation of band non-parabolicities in strain-balanced GaInAs/GaAlInAs coupled quantum wells. SUPERLATTICE MICROST, 22(4), 517-520.
- Electrical and optical bistability in [111]GaInAs-GaAs piezo-electric quantum wells. SUPERLATTICE MICROST, 21(1), 113-118.
- Investigation of impact ionization in thin GaAs diodes. IEEE T ELECTRON DEV, 43(7), 1066-1072.
- Optical spectroscopic observation of spontaneous long range ordering in AlGaInP. APPL PHYS LETT, 68(23), 3266-3268.
- Excitation power and barrier width dependence of photoluminescence in piezoelectric multiquantum well p-i-n structures. APPL PHYS LETT, 68(6), 820-822.
- . Electronics Letters, 32(6), 559-560.
- . IEEE Photonics Technology Letters, 8(4), 473-475.
- . IEEE Transactions on Electron Devices, 43(12), 2303-2305.
- . Materials Science and Engineering B, 42(1-3), 43-51.
- . Applied Physics Letters, 68(12), 1595-1597.
- . Journal of Applied Physics, 80(10), 5815-5820.
- Photoconductivity studies of InAsP/InP heterostructures in applied magnetic and electric fields. SEMICOND SCI TECH, 11(1), 34-38.
- InxGa1-xAs/InP quantum well structures grown on [111]B InP. MICROELECTR J, 26(8), 805-810.
- Growth of pseudomorphic InGaAs/GaAs quantum wells on [111]B GaAs for strained layer, piezoelectric, optoelectronic devices. MICROELECTR J, 26(8), 811-820.
- GROWTH OF INASXP1-X/INP MULTIQUANTUM-WELL STRUCTURES BY SOLID SOURCE MOLECULAR-BEAM EPITAXY. J APPL PHYS, 78(5), 3330-3334.
- Partial screening of internal electric fields in strained piezoelectric quantum well lasers: Implications for optoelectronic integration. Applied Physics Letters, 1595.
- . Applied Physics Letters, 2876.
x Ga1-x As/InP multiquantum well structures grown on [111]B InP substrates. Conference Proceedings - International Conference on Indium Phosphide and Related Materials, 299-302.
In- . Applied Physics Letters, 67, 906.
- HIGH-PURITY ALGAAS FROM METHYL-BASED PRECURSORS USING IN-SITU GETTERING OF ALKOXIDES. J CRYST GROWTH, 145(1-4), 968-969.
- CARRIER SCREENING EFFECTS IN PIEZOELECTRIC STRAINED INGAAS/GAAS QUANTUM-WELLS GROWN ON THE [111]B AXIS. J APPL PHYS, 76(9), 5447-5452.
- ELECTROABSORPTION MODULATION IN STRAINED PIEZOELECTRIC INGAAS/INP MULTIQUANTUM WELLS OPERATING AT LAMBDA-SIMILAR-OR-EQUAL-TO-1.55 MU-M. ELECTRON LETT, 30(20), 1707-1708.
- GROWTH AND CHARACTERIZATION OF (111)B INGAAS/GAAS MULTIQUANTUM-WELL PIN DIODE STRUCTURES. J ELECTRON MATER, 23(9), 975-982.
- ELECTRONIC BAND-STRUCTURE OF ALGAINP GROWN BY SOLID-SOURCE MOLECULAR-BEAM EPITAXY. APPL PHYS LETT, 65(2), 213-215.
- AVALANCHE BREAKDOWN IN (AL(X)GA(1X))0.52IN0.48P PIN JUNCTIONS. ELECTRON LETT, 30(11), 907-909.
- SOLID-SOURCE MOLECULAR-BEAM EPITAXY GROWTH OF GAINP AND GAINP-CONTAINING QUANTUM-WELLS. J APPL PHYS, 75(4), 2029-2034.
- ELECTROLUMINESCENCE FROM INGAAS/INALAS HEMTS. ELECTRON LETT, 30(14), 1181-1183.
- . Applied Physics Letters, 65(7), 839-841.
- . Journal of Applied Physics, 76(10), 5931-5944.
- Reverse breakdown characteristics in InGa(Al)P/InGaP p-i-n junctions. Conference Proceedings - International Conference on Indium Phosphide and Related Materials, 403-406.
- . Electronics Letters, 30(18), 1521-1522.
- . Journal of Crystal Growth, 143(3-4), 135-140.
- OPTICAL SPECTROSCOPY OF ALGAINP BASED WIDE-BAND GAP QUANTUM-WELLS. SUPERLATTICE MICROST, 15(3), 313-316.
- . Phys Rev B Condens Matter, 48(11), 8491-8494.
- TAILORING OF INTERNAL FIELDS IN INGAAS/GAAS MULTIWELL STRUCTURES GROWN ON (111)B GAAS. APPL PHYS LETT, 63(6), 752-754.
- PHOTOLUMINESCENCE, PHOTOLUMINESCENCE EXCITATION, AND RESONANT RAMAN-SPECTROSCOPY OF DISORDERED AND ORDERED GA0.52IN0.48P. J APPL PHYS, 73(10), 5163-5172.
- Growth and characterisation of InAsP/InP SQW and MQW PIN diode structures. 1993 IEEE 5th International Conference on Indium Phosphide and Related Materials, 167-170.
- DETERMINATION OF LOW-TEMPERATURE IMPACT IONIZATION COEFFICIENTS IN GAAS BY ELECTROLUMINESCENCE MEASUREMENTS ON SINGLE BARRIER TUNNELING STRUCTURES. APPL PHYS LETT, 61(7), 825-827.
- GROWTH OF STRAINED INAS/INP QUANTUM-WELLS BY MOLECULAR-BEAM EPITAXY. APPL PHYS LETT, 60(7), 841-843.
- . Journal of Crystal Growth, 124(1-4), 792-800.
- . Applied Physics Letters, 61(17), 2042-2044.
- . Applied Physics Letters, 61(10), 1225-1227.
- IMPACT IONIZATION AND ELECTROLUMINESCENCE IN SINGLE BARRIER TUNNELING STRUCTURES. SUPERLATTICE MICROST, 12(4), 443-446.
- ALGAAS/GAAS P-MODFET MATERIALS GROWN USING INTRINSIC CARBON DOPING. JOURNAL OF CRYSTAL GROWTH, 107(1-4), 915-920.
- . Journal of Electronic Materials, 20(4), 295-297.
- LOW LEAKAGE INGAAS/GAAS STRAINED LAYER MQWPIN STRUCTURES. J ELECTRON MATER, 19(7), 56-56.
- . Applied Physics Letters, 56(3), 268-270.
- . Electronics Letters, 26(25), 2117-2118.
- . Journal of Crystal Growth, 104(4), 857-860.
- DISORDERING OF IN0.53GA0.47AS/INP MULTIPLE QUANTUM-WELLS BY SULFUR OR ZINC DIFFUSION AND PROTON-BOMBARDMENT. INST PHYS CONF SER(96), 397-400.
- . Journal of Applied Physics, 66(2), 975-977.
- . IEEE Electron Device Letters, 10(7), 294-296.
- MOVPE GROWN MQW PIN DIODES FOR ELECTRO-OPTIC MODULATORS AND PHOTODIODES WITH ENHANCED ELECTRON IONIZATION COEFFICIENT. J CRYST GROWTH, 93(1-4), 877-884.
- GAAS/ALGAAS MULTIPLE QUANTUM WELL PIN DIODES GROWN BY SELECTIVE AREA EPITAXY. ELECTRON LETT, 24(14), 896-898.
- . Semiconductor Science and Technology, 3(6), 601-604.
- . Applied Physics Letters, 52(24), 2013-2014.
- . Electronics Letters, 24(15), 910-911.
- . Electronics Letters, 24(19), 1217-1218.
- QUANTUM CONFINED STARK SHIFTS IN MOVPE-GROWN GAAS-ALGAAS MULTIPLE QUANTUM-WELLS. ELECTRON LETT, 23(20), 1048-1050.
- GROWTH AND CHARACTERIZATION OF QUANTUM-WELLS AND SELECTIVELY DOPED HETEROSTRUCTURES OF INP/GA0.47IN0.53AS GROWN BY SOLID SOURCE MBE. J CRYST GROWTH, 81(1-4), 288-295.
- ALL-OPTICAL SWITCHING EFFECTS IN A PASSIVE GAAS/GAALAS MULTIPLE-QUANTUM-WELL WAVE-GUIDE RESONATOR. ELECTRON LETT, 22(21), 1129-1130.
- NONLINEAR PROPERTIES OF GaAs/GaAlAs MULTI-QUANTUM-WELL OPTICAL WAVEGUIDES.. IEE Colloquium (Digest)(1986 /128).
- . Electronics Letters, 22(10), 506-507.
- IONIZATION COEFFICIENT IN GAAS, DOPING DEPENDENCE. IEE PROC-I, 132(1), 47-47.
- MEASURED IONIZATION COEFFICIENTS IN Ga//1// minus //xAl//xAs.. Institute of Physics Conference Series(74), 247-252.
- GATE DRAIN AVALANCHE BREAKDOWN IN GAAS POWER MESFETS. IEEE T ELECTRON DEV, 29(10), 1548-1552.
- . ACS Photonics.
- . Communications Materials, 5(1).
- . Photonics, 10(7), 715-715.
- . Solid State Phenomena, 343, 99-104.
- . Journal of Electronic Materials.
- Design, fabrication and characterisation of InGaAs/InP single-photon avalanche diode detectors.
Chapters
- , Bismuth-Containing Alloys and Nanostructures (pp. 299-318). Springer Singapore
- , Microscopy of Semiconducting Materials 2003 (pp. 107-110).
- , Encyclopedia of Modern Optics (pp. 358-363). Elsevier
- , Hot Carriers in Semiconductors (pp. 343-346). Springer US
- CRC Press
Conference proceedings papers
- . Emerging Imaging and Sensing Technologies for Security and Defence IX (pp 17-17), 16 September 2024 - 20 September 2024.
- . Infrared Sensors, Devices, and Applications XIV (pp 12-12), 18 August 2024 - 23 August 2024.
- . Optical Sensing and Detection VIII, 7 April 2024 - 12 April 2024.
- . Infrared Technology and Applications L, 21 April 2024 - 26 April 2024.
- . Optical Components and Materials XXI, 27 January 2024 - 1 February 2024.
- . 2023 IEEE Regional Symposium on Micro and Nanoelectronics (RSM), 28 August 2023 - 30 August 2023.
- . Emerging Imaging and Sensing Technologies for Security and Defence VII, 5 September 2022 - 8 September 2022.
- . 2022 IEEE 8th International Conference on Smart Instrumentation, Measurement and Applications (ICSIMA), 26 September 2022 - 28 September 2022.
- . Biomedical Spectroscopy, Microscopy, and Imaging II, 3 April 2022 - 23 May 2022.
- . Optical Sensing and Detection VII, 3 April 2022 - 16 May 2022.
- . Optical Components and Materials XIX (pp 19)
- . Emerging Imaging and Sensing Technologies for Security and Defence V; and Advanced Manufacturing Technologies for Micro- and Nanosystems in Security and Defence III, 21 September 2020 - 25 September 2020.
- . 2020 IEEE 8th International Conference on Photonics (ICP), 12 May 2020 - 30 June 2020.
- . Optical Components and Materials XVII, 1 February 2020 - 6 February 2020.
- . 2018 IEEE International Conference on Semiconductor Electronics (ICSE), 15 August 2018 - 17 August 2018.
- . 2017 IEEE GLOBECOM WORKSHOPS (GC WKSHPS)
- . 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 25 June 2017 - 30 June 2017.
- . Journal of Crystal Growth, Vol. 477(Proceeding of the 19th International Conference on Molecular Beam Epitaxy) (pp 139-143). Le Corum - Montepllier, France, 4 September 2016 - 9 September 2016.
- . Advanced Photon Counting Techniques XI
- . Proceedings of SPIE, Vol. 9988, 26 September 2016 - 27 September 2016.
- . 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 5 June 2016 - 10 June 2016.
- . 2016 IEEE 6th International Conference on Photonics (ICP), 14 March 2016 - 16 March 2016.
- . IET Optoelectronics, Vol. 10(2) (pp 34-38)
0.52 In0.48 P photodetectors for underwater communication systems. Asia Communications and Photonics Conference, ACPC 2015
Al- . 2015 IEEE Regional Symposium on Micro and Nanoelectronics (RSM), 19 August 2015 - 21 August 2015.
- . 2015 IEEE 26th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications (PIMRC), 30 August 2015 - 2 September 2015.
- . Asia Communications and Photonics Conference 2015, 2015.
- . Unmanned/Unattended Sensors and Sensor Networks XI; and Advanced Free-Space Optical Communication Techniques and Applications
- . 2015 IEEE 81st Vehicular Technology Conference (VTC Spring), 11 May 2015 - 14 May 2015.
- . 2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS), 7 December 2014 - 10 December 2014.
- . 2014 IEEE Photonics Conference, 12 October 2014 - 16 October 2014.
- . 2014 IEEE Photonics Conference, 12 October 2014 - 16 October 2014.
- . 2014 IEEE Photonics Conference, 12 October 2014 - 16 October 2014.
- . 2014 IEEE International Conference on Semiconductor Electronics (ICSE2014), 27 August 2014 - 29 August 2014.
- . Emerging Technologies in Security and Defence II; and Quantum-Physics-based Information Security III
- Performance evaluation of IEEE 802.15.7 CSK physical layer. Globecom Workshops (GC Wkshps), 2013 IEEE
- . 4th International Conference on Photonics, ICP 2013 - Conference Proceeding (pp 78-80)
- . EMERGING TECHNOLOGIES IN SECURITY AND DEFENCE; AND QUANTUM SECURITY II; AND UNMANNED SENSOR SYSTEMS X, Vol. 8899
- . EMERGING TECHNOLOGIES IN SECURITY AND DEFENCE; AND QUANTUM SECURITY II; AND UNMANNED SENSOR SYSTEMS X, Vol. 8899
- . IEEE Photonics Conference 2012, 23 September 2012 - 27 September 2012.
- . Technical Digest - 2012 17th Opto-Electronics and Communications Conference, OECC 2012 (pp 220-221)
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 8256
- . IEEE Nuclear Science Symposium Conference Record (pp 2238-2241)
- . IEEE Nuclear Science Symposium Conference Record (pp 2071-2073)
- . IEEE Nuclear Science Symposium Conference Record (pp 4809-4811)
- . IEEE Nuclear Science Symposium Conference Record (pp 4528-4531)
- . IEEE Photonic Society 24th Annual Meeting, PHO 2011 (pp 31-32)
- . IEEE Photonic Society 24th Annual Meeting, 9 October 2011 - 13 October 2011.
- High detectivity MWIR type-II superlattice grown on a GaAs substrate. IEEE Photonic Society 24th Annual Meeting, PHO 2011 (pp 31-32)
- . 2010 Photonics Global Conference, PGC 2010
- . 2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010 (pp 706-707)
- . INFRARED TECHNOLOGY AND APPLICATIONS XXXVI, PTS 1 AND 2, Vol. 7660
- . 2010 23rd Annual Meeting of the IEEE Photonics Society, PHOTINICS 2010 (pp 126-127)
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7838
- . Conference Proceedings - International Conference on Indium Phosphide and Related Materials (pp 187-190)
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7681
- . Conference Proceedings - International Conference on Indium Phosphide and Related Materials (pp 421-424)
- . Conference Proceedings - International Conference on Indium Phosphide and Related Materials (pp 409-412)
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7726
- . SILICON CARBIDE AND RELATED MATERIALS 2009, PTS 1 AND 2, Vol. 645-648 (pp 1081-1084)
- The development of extremely low noise InAs electron APDs for photon counting applications in SWIR/MWIR wavelengths. PHOTON COUNTING APPLICATIONS, QUANTUM OPTICS, AND QUANTUM INFORMATION TRANSFER AND PROCESSING II, Vol. 7355
- Extended Wavelength Avalanche Photodiodes. 2009 4TH INTERNATIONAL CONFERENCE ON COMPUTERS AND DEVICES FOR COMMUNICATION (CODEC 2009) (pp 454-457)
- Potential Materials for Avalanche Photodiodes Operating above 10Gb/s. 2009 4TH INTERNATIONAL CONFERENCE ON COMPUTERS AND DEVICES FOR COMMUNICATION (CODEC 2009) (pp 442-447)
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7298
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7355
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7320
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7298
- Low Strain Multiple Stack Quantum Dot Infrared Photodetectors for Multispectral and High Resolution Hyperspectral Imaging. 2009 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1AND 2 (pp 166-167)
- Dark current mechanisms in InxGa1-xAs1-yNy. 2009 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1AND 2 (pp 233-234)
- Type-II photodiode and APD for detection in the 2-2.5 mu m wavelength range. 2009 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1AND 2 (pp 293-294)
- Temperature Dependence of Hole Impact Ionization Coefficient in 4H-SiC Photodiodes. SILICON CARBIDE AND RELATED MATERIALS 2008, Vol. 615-617 (pp 311-314)
- Avalanche Multiplication and Impact Ionisation in Separate Absorption and Multiplication 4H-SiC Avalanche Photodiodes. SILICON CARBIDE AND RELATED MATERIALS 2007, PTS 1 AND 2, Vol. 600-603 (pp 1207-1210)
- . 2008 IEEE International Conference on Semiconductor Electronics, 25 November 2008 - 27 November 2008.
- . Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS (pp 296-297)
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7113
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7113
- . Proceedings of SPIE - The International Society for Optical Engineering, Vol. 7113
- OPTIMIZATION OF InP APDs FOR HIGH-SPEED LIGHTWAVE SYSTEMS. 2008 IEEE 20TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS (IPRM) (pp 319-322)
- DESIGN CONSIDERATIONS FOR IN(0.52)AL(0.48)AS BASED AVALANCHE PHOTODIODES. 2008 IEEE 20TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS (IPRM) (pp 331-333)
- DARK CURRENT MECHANISMS IN BULK GaInNAs PHOTODIODES. 2008 IEEE 20TH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS (IPRM) (pp 345-348)
- Effects of spacer growth temperature on the optical properties of quantum dot laser structures - art. no. 68000U. DEVICE AND PROCESS TECHNOLOGIES FOR MICROELECTRONICS, MEMS, PHOTONICS AND NANOTECHNOLOGY IV, Vol. 6800 (pp U8000-U8000)
- Fabrication of InAs Photodiodes with reduced surface leakage current - art. no. 67400H. OPTICAL MATERIALS IN DEFENCE SYSTEMS TECHNOLOGY IV, Vol. 6740 (pp H7400-H7400)
- The effects of monolayer thickness and sheet doping density on dark current and noise current in Quantum Dot Infrared Photodetectors - art. no. 67400J. OPTICAL MATERIALS IN DEFENCE SYSTEMS TECHNOLOGY IV, Vol. 6740 (pp J7400-J7400)
- Impact ionization of sub-micron InP structures. 2007 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 (pp 515-516)
- Temperature dependence of breakdown voltage of InP and InAlAs avalanche photodiodes. 2007 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 (pp 513-514)
- Determination of impact ionization coefficients measured from 4H-silicon carbide avalanche photodiodes. Silicon Carbide and Related Materials 2006, Vol. 556-557 (pp 339-342)
- Extremely low excess noise InAlAs avalanche photodiodes. 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings (pp 81-83)
- Temperature dependence of inp-based avalanche photodiodes. 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings (pp 296-298)
- InP-based avalanche photodiodes with > 2.1 mu m detection capability. 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings (pp 293-295)
- Gainnas lattice-matched to GaAs for photodiodes. 2007 International Conference on Indium Phosphide and Related Materials, Conference Proceedings (pp 347-349)
- . IEE P-OPTOELECTRON, Vol. 153(4) (pp 191-194)
- Design, fabrication and characterisation of InGaAs/InP single-photon avalanche diode detectors. Optics InfoBase Conference Papers
- Excess noise and avalanche multiplication in InAlAs. 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2 (pp 787-788)
- A comparison of the lower limit of multiplication noise in InP and InAlAs based APDs for telecommunications receiver applications. 2006 IEEE LEOS Annual Meeting Conference Proceedings, Vols 1 and 2 (pp 789-790)
- . Electro-Optical and Infrared Systems: Technology and Applications III, Vol. 6395 (pp U102-U110)
- . MATERIALS SCIENCE & ENGINEERING C-BIOMIMETIC AND SUPRAMOLECULAR SYSTEMS, Vol. 25(5-8) (pp 779-783)
- Low noise avalanche photodiodes. 2005 IEEE LEOS Annual Meeting Conference Proceedings (LEOS) (pp 368-369)
- Avalanche noise in In0.53Ga0.44As avalanching regions. 2005 International Conference on Indium Phosphide and Related Materials (pp 428-431)
- . IEE PROCEEDINGS-OPTOELECTRONICS, Vol. 151(5) (pp 301-304)
- . IEE PROCEEDINGS-OPTOELECTRONICS, Vol. 151(5) (pp 331-334)
- . JOURNAL OF MODERN OPTICS, Vol. 51(9-10) (pp 1315-1321)
- . Device Research Conference - Conference Digest, DRC (pp 79-80)
- Avalanche multiplication and breakdown in 4H-SiC diodes. SILICON CARBIDE AND RELATED MATERIALS 2003, PTS 1 AND 2, Vol. 457-460 (pp 1069-1072)
- Physics & design of low noise avalanche photodiodes. CAOL '2003: PROCEEDINGS OF THE 1ST INTERNATIONAL CONFERENCE ON ADVANCED OPTOELECTRONICS AND LASERS, VOL 1 (pp 99-99)
- Physics and design of low noise avalanche photodiodes - LEOS distinguished lecture 2003-2004. ICTON 2003: 5TH INTERNATIONAL CONFERENCE ON TRANSPARENT OPTICAL NETWORKS, VOL 2, PROCEEDINGS (pp 170-170)
- Lonisation dead space and the super-APD. 2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 (pp 995-996)
- Effect of temperature on the avalanche properties of sub-micron structures. COMPOUND SEMICONDUCTORS 2002, Vol. 174 (pp 263-266)
- High gain, low noise 4H-SiC UV avalanche photodiodes. COMPOUND SEMICONDUCTORS 2002, Vol. 174 (pp 355-358)
- In0.53Ga0.47As ionization coefficients deduced from photomultiplication measurements. COMPOUND SEMICONDUCTORS 2002, Vol. 174 (pp 267-270)
- Theoretical study of breakdown probabilities in single photon avalanche diodes. 2003 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2 (pp 773-774)
- Low Noise Avalanche Photodiodes. Optics InfoBase Conference Papers (pp 19-20)
- Temperature dependence of avalanche multiplication in GaAs. EDMO 2002: 10TH IEEE INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (pp 226-230)
- Temperature dependence of In0.53Ga0.47As ionisation coefficients. EDMO 2002: 10TH IEEE INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (pp 316-320)
- . IEE P-OPTOELECTRON, Vol. 148(5-6) (pp 225-228)
- Photocurrent spectroscopy of InAs/GaAs self-assembled quantum dots. PHYSICA STATUS SOLIDI B-BASIC RESEARCH, Vol. 224(2) (pp 497-502)
- GaN Schottky ultraviolet photodetectors using the metal-semiconductor-metal structure. EDMO 2001: INTERNATIONAL SYMPOSIUM ON ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (pp 131-136)
- Design considerations for high-speed low-noise avalanche photodiodes. DESIGN, FABRICATION, AND CHARACTERIZATION OF PHOTONIC DEVICES II, Vol. 4594 (pp 1-9)
- Avalanche multiplication noise in bulk and thin AlxGa1-xAs (x=0-0.8) PIN and NIP diodes. PHOTODETECTORS: MATERIALS AND DEVICES VI, Vol. 4288 (pp 39-46)
- How avalanche pulses evolve in space and time. PHYSICS AND SIMULATION OF OPTOELECTRONIC DEVICES IX, Vol. 4283 (pp 511-518)
- Photocurrent spectroscopy of InAs/GaAs self-assembled quantum dots: observation of a permanent dipole moment. PHYSICA E, Vol. 7(3-4) (pp 408-412)
- Avalanche multiplication and noise in sub-micron Si p-i-n diodes. Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3953 (pp 95-102)
- Low avalanche excess noise in thin AlxGa1-xAs (x=0.15 and 0.60) avalanche photodiodes. 2000 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS (pp 34-38)
- Low avalanche noise behaviour in bulk Al0.8Ga0.2As. 2001 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (pp 519-523)
- Avalanche multiplication and noise in sub-micron Si p-i-n diodes. SILICON-BASED OPTOELECTRONICS II, Vol. 3953 (pp 95-102)
- Design of low-noise avalanche photodiodes. OPTOELECTRONIC INTEGRATED CIRCUITS IV, Vol. 3950 (pp 30-38)
- Photocurrent spectroscopy of InAs/GaAs self-assembled quantum dots: Observation of a permanent dipole moment. SEMICONDUCTOR QUANTUM DOTS, Vol. 571 (pp 147-152)
- . Design, Fabrication, and Characterization of Photonic Devices
- Electric field gradient dependence of excess avalanche noise. Workshop on High Performance Electron Devices for Microwave and Optoelectronic Applications, EDMO (pp 230-235)
- Improved excess noise and temperature dependence of multiplication characteristics in thin InP avalanching regions. Conference Proceedings - International Conference on Indium Phosphide and Related Materials (pp 295-298)
- Monte Carlo estimation of excess noise factor in thin p(+)-i-n(+) avalanche photodiodes. 1997 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (pp 631-634)
- Low noise avalanche photodetectors. Conference on Lasers and Electro-Optics Europe - Technical Digest (pp 383)
- Avalanche multiplication in sub-micron AlxGa1-xAs/GaAs heterostructures. 1997 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (pp 391-394)
- Wide bandgap collectors in GaInP/GaAs heterojunction bipolar transistors with increased breakdown voltage. 1997 IEEE INTERNATIONAL SYMPOSIUM ON COMPOUND SEMICONDUCTORS (pp 435-438)
- Wide bandgap collectors in GaInP/GaAs heterojunction bipolar transistors with increased breakdown voltage. COMPOUND SEMICONDUCTORS 1997, Vol. 156 (pp 435-438)
- . Conference on Lasers and Electro-Optics-Europe, 1998.
- . Conference on Lasers and Electro-Optics-Europe, 1998.
- . Fabrication, Testing, and Reliability of Semiconductor Lasers II
- Incorporation of As-2 in InAsxP1-x and its application to InAsxP1-x/InP quantum well structures. JOURNAL OF CRYSTAL GROWTH, Vol. 175 (pp 1033-1038)
- Monte Carlo modelling of impact ionisation in GaAs. COMPOUND SEMICONDUCTORS 1996(155) (pp 629-632)
- Monte Carlo simulation of impact ionization effects in MSM photodetectors and MESFET's.. COMPOUND SEMICONDUCTORS 1996(155) (pp 659-662)
- . Vertical-Cavity Surface-Emitting Lasers
- All-optical modulation near 1.55 mu m using In1-x-yGaxAlyAs coupled quantum wells. COMPOUND SEMICONDUCTORS 1996(155) (pp 539-542)
- Impact ionisation and temperature dependence of breakdown in Ga0.52In0.48P. COMPOUND SEMICONDUCTORS 1996(155) (pp 585-588)
- Optical spectroscopic determination of the electronic band structure of bulk AlGaInP and GaInP-AlGaInP heterojunction band offsets. IN-PLANE SEMICONDUCTOR LASERS: FROM ULTRAVIOLET TO MIDINFRARED, Vol. 3001 (pp 135-146)
- Avalanche photodiode (APD) noise dependence on avalanche region width. 55TH ANNUAL DEVICE RESEARCH CONFERENCE, DIGEST - 1997 (pp 170-171)
- Breakdown behaviour in wide bandgap collector GaInP/GaAs double heterojunction bipolar transistors. EDMO - 1997 WORKSHOP ON HIGH PERFORMANCE ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (pp 273-278)
- Impact ionisation coefficients in (AlxGa1-x)(0.52)In0.48P. COMPOUND SEMICONDUCTORS 1995, Vol. 145 (pp 569-574)
- Breakdown characteristics of (AlXGa1-X)(0.52)In0.48P p-i-n diodes. ICSE '96 - 1996 IEEE INTERNATIONAL CONFERENCE ON SEMICONDUCTOR ELECTRONICS, PROCEEDINGS (pp 256-260)
- Electron and hole multiplication characteristics in short GaAs PINs. COMPOUND SEMICONDUCTORS 1995, Vol. 145 (pp 563-568)
- Multiplication characteristics of thin AlxGa1-xAs (x=0 to 0.3) diodes. 1996 54TH ANNUAL DEVICE RESEARCH CONFERENCE DIGEST (pp 44-45)
- Photoluminescence of piezoelectric strained InGaAs-GaAs multi-quantum well p-i-n structures. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, Vol. 35(1-3) (pp 42-46)
- Visible vertical cavity surface emitting lasers at lambda<650 nm. MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, Vol. 35(1-3) (pp 12-16)
- Exciton effects in strain-balanced GaInAs/AlInAs and GaInAs/GaInAs coupled quantum wells.. NUOVO CIMENTO DELLA SOCIETA ITALIANA DI FISICA D-CONDENSED MATTER ATOMIC MOLECULAR AND CHEMICAL PHYSICS FLUIDS PLASMAS BIOPHYSICS, Vol. 17(11-12) (pp 1607-1612)
- InxGa1-xAs/InP multiquantum well structures grown on [111]B InP substrates. SEVENTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS, CONFERENCE PROCEEDINGS (pp 299-302)
- Non-local effects on the multiplication characteristics of thin GaAs p-i-n and n-i-p diodes. 1995 WORKSHOP ON HIGH PERFORMANCE ELECTRON DEVICES FOR MICROWAVE AND OPTOELECTRONIC APPLICATIONS (EDMO) (pp 64-69)
- SPECTROSCOPIC STUDY OF PIEZOELECTRIC FIELD EFFECTS IN INGAAS/GAAS MULTIQUANTUM WELLS GROWN ON (111)B ORIENTED GAAS SUBSTRATES. SOLID-STATE ELECTRONICS, Vol. 37(4-6) (pp 645-648)
- . Integrated Photonics Research, 1994.
- LEAKAGE CURRENT MECHANISMS IN STRAINED INGAAS/GAAS MQW STRUCTURES. GALLIUM ARSENIDE AND RELATED COMPOUNDS 1993, Vol. 136(136) (pp 373-378)
- AVALANCHE BREAKDOWN IN GAAS/ALXGA1-XAS MULTILAYERS AND ALLOYS. GALLIUM ARSENIDE AND RELATED COMPOUNDS 1993, Vol. 136(136) (pp 721-726)
- OPTOELECTRONIC EFFECTS AND FIELD DISTRIBUTION IN STRAINED (111)B INGAAS/ALGAAS MQW PIN DIODES. GALLIUM ARSENIDE AND RELATED COMPOUNDS 1993, Vol. 136(136) (pp 331-336)
- REVERSE BREAKDOWN CHARACTERISTICS IN INGA(AL)P INGAP P-I-N JUNCTIONS. SIXTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS: CONFERENCE PROCEEDINGS (pp 403-406)
- GROWTH AND CHARACTERIZATION OF HIGH-QUALITY GAINP/ALGAINP QUANTUM-WELLS BY SOLID-SOURCE MOLECULAR-BEAM EPITAXY. SIXTH INTERNATIONAL CONFERENCE ON INDIUM PHOSPHIDE AND RELATED MATERIALS: CONFERENCE PROCEEDINGS (pp 551-554)
- Demonstration of All-Optical Bistability in a Strained Piezoelectric Self Electro-optic Effect Device. Optics InfoBase Conference Papers (pp 260-262)
- DEVICES AND DESIRES IN THE 2-4 MU-M REGION BASED ON ANTIMONY-CONTAINING III-V HETEROSTRUCTURES GROWN BY MOVPE. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, Vol. 8(1) (pp S380-S385)
- QUANTUM-CONFINED STARK-EFFECT IN INGAAS/INP MULTIPLE QUANTUM-WELLS GROWN BY SOLID SOURCE MOLECULAR-BEAM EPITAXY. JOURNAL OF CRYSTAL GROWTH, Vol. 111(1-4) (pp 1080-1083)
- DISORDERING OF IN0.53GA0.47AS/INP MULTIPLE QUANTUM-WELLS BY SULFUR OR ZINC DIFFUSION AND PROTON-BOMBARDMENT. GALLIUM ARSENIDE AND RELATED COMPOUNDS 1988 (pp 397-400)
- (pp 339-342)
- . Proceedings of CAOL'2003. 1st International Conference on Advanced Optoelectronics and Lasers. Jontly with 1st Workshop on Precision Oscillations in Electronics and Optics (IEEE Cat. No.03EX715)
- . HITEN 99. Third European Conference on High Temperature Electronics. (IEEE Cat. No.99EX372)
- . Conference Proceedings. 1998 International Conference on Indium Phosphide and Related Materials (Cat. No.98CH36129)
- . Conference Proceedings. 1997 International Conference on Indium Phosphide and Related Materials
- . Seventh International Conference on Indium Phosphide and Related Materials
- . 1993 (5th) International Conference on Indium Phosphide and Related Materials
- . LEOS 1992 Summer Topical Meeting Digest on Broadband Analog and Digital Optoelectronics, Optical Multiple Access Networks, Integrated Optoelectronics, and Smart Pixels
- . [Proceedings 1991] Third International Conference Indium Phosphide and Related Materials
Preprints
- , arXiv.
- Performance Evaluation of Frequency Domain Equalisation Based Colour Shift Keying Modulation Schemes Over Diffuse Optical Wireless Channels, arXiv.
- Design, fabrication and characterisation of InGaAs/InP single-photon avalanche diode detectors, arXiv.
- Design and Performance of an InGaAs-InP Single-Photon Avalanche Diode Detector, arXiv.
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