Professor Shankar Madathil
PhD, MTech, MSc, BSc
School of Electrical and Electronic Engineering
Chair in Power Electronic Systems
Electrical Machines and Drives Research Group
Rolls-Royce/Royal Academy of Engineering Research Chair
+44 114 222 5856
Full contact details
School of Electrical and Electronic Engineering
Sir Frederick Mappin Building
Mappin Street
葫芦影业
S1 3JD
- Profile
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Prof Shankar N Ekkanath Madathil was a Royal Academy of Engineering Research Professor in Power Electronics (2007-12) and a Royal Society Industry Fellow of Rolls-Royce (2013-17).
Between 1994 and 2007, he was the Founding Director of the Emerging Technologies Research Centre at De Montfort University, which he established to undertake research in microelectronics.
Prior to that, he was elected as a Maudslay Engineering Research Fellow of Pembroke College, Cambridge.
He completed his PhD in Cambridge University through support from Cambridge Nehru scholarship and has a Master’s degree in Semiconductor Technology and a Master’s degree in Materials Science.
He has more than three decades of proven track record in the field of power semiconductor devices and associated technologies and works with key supply chain partners world-wide.
His group has already delivered world-leading innovative power semiconductor device solutions in Silicon (Si) and wide band gap materials such as Gallium Nitride (GaN) and Silicon Carbide (SiC).
His notable contributions include the Clustered IGBT concept in Silicon and Silicon Carbide; the first demonstration of 3 kV Intelligent Power Chip in Silicon, record low on-state resistance 100 V devices in Silicon, world first demonstration of high density 2 Dimensional Hole Gas in GaN and most recently, ground-breaking super-junction switching technologies in GaN. As PI/Co-I, he has successfully led projects to transfer innovative power device technologies to industry.
He was an invited Fellow at the National Institute of Advanced Industrial Science and Technology, Tsukuba, Japan in 2005 & 2007. He is a Visiting Professor and Vajra Faculty in IIT Bombay, India.
Most recently, he has been offered short-term Invitation Fellowship by Japanese Society of Promotion of Sciences to spend two months at Kyushu University in Japan.
He is an editor of IEEE – Transactions in Electron Devices, IEEE - Transactions in Devices and Materials Reliability, Proceedings of the Royal Society – Mathematical, Physical and Engineering Sciences and an associated editor of IET – Journal of Power Electronics.
He is a Fellow of IET and IOP. Presently, he is involved as a Technical Program Committee member in various IEEE and premier conferences such as IEDM and ESSDERC/ESSIRC.
- Qualifications
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- PhD (Engineering), University of Cambridge 1992
- MTech (Physical Engineering), Indian Institute of Science, Bangalore 1986
- MSc (Applied Sciences), PSG College of Technology, India 1984
- BSc (Applied Sciences), PSG College of Technology, India 1982
- Research interests
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- Power semiconductor devices and technologies
- High temperature power electronics
- Active gate drive technologies
- High power density converters
- Power integrated circuits for lighting, automotive and switched mode power supplies
- High voltage thin film transistors and integration aspects
- Modelling of power semiconductor devices and technologies
- New concepts for semiconductor devices and technologies
- Power semiconductor devices and technologies for harsh environments
- Wide band gap power semiconductor devices and technologies
- Nano technologies for power electronic applications
- Publications
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Journal articles
- . physica status solidi (a).
- . Japanese Journal of Applied Physics, 62.
- . Japanese Journal of Applied Physics, 62(3), 039401-039401.
- . IEEE Transactions on Power Electronics.
- . IEEE Transactions on Electron Devices.
- . IET Journal of Power Electronics, 12(15), 3859-3860.
- . IEEE Electron Device Letters, 39(9), 1350-1353.
- . IET Power Electronics, 11(14), 2198-2203.
- . IEEE Transactions on Electron Devices, 65(4), 1440-1446.
- . IET Power Electronics, 11(4), 627-628.
- . Journal of Physics D: Applied Physics, 51(16), 163001-163001.
- The 2018 GaN power electronics roadmap. Journal of Physics D: Applied Physics, 51(16), 163001.
- . IET Power Electronics.
- . Physica Status Solidi (A), 214(8).
- . Solid-State Electronics, 125, 111-117.
- , 199-199.
- . Facta universitatis - series: Electronics and Energetics, 29(1), 1-10.
- . IET Power Electronics, 8(12), 2429-2434.
- . IET Power Electronics, 8(12), 2307-2307.
- . Electronics Letters, 51(1), 108-110.
- . Microelectronics Reliability, 54(9-10), 2242-2247.
- . IECON Proceedings (Industrial Electronics Conference), 544-548.
- . IEEE Transactions on Electron Devices.
- . Ieee Transactions on Power Electronics, 27, 3072-3080.
- . IEEE Transactions on Electron Devices, 59(12), 3464-3469.
- . IEEE Transactions on Electron Devices, 59(5), 1439-1444.
- . Materials Science Forum, 717-720, 1139-1142.
- . IEEE Transactions on Power Electronics, 27(5), 2673-2679.
- GaN power devices using the polarization junction concept. 電気学会研究会資料. SPC, 半導体電力変換研究会, 2011(142), 1-6.
- GaN power devices using the polarization junction concept. 電気学会研究会資料. EDD, 電子デバイス研究会, 2011(50), 1-6.
- . IEEE ELECTR DEVICE L, 32(9), 1272-1274.
- . IEEE Electron Device Letters, 32(4), 542-544.
- . SPEEDAM 2010 - International Symposium on Power Electronics, Electrical Drives, Automation and Motion, 545-550.
- . Applied Physics Express, 3(12).
- . IEEE Transactions on Power Electronics, 25(3), 583-591.
- . Japanese Journal of Applied Physics, 49(4 PART 2).
- . IEEE Electron Device Letters, 30(4), 416-418.
- . IEEE Transactions on Power Electronics, 24(4), 1100-1106.
- . IEEE Transactions on Power Electronics, 22(4), 1177-1185.
- . IEEE Transactions on Power Electronics, 22(5), 1857-1866.
- . IEE Proceedings: Circuits, Devices and Systems, 153(1), 67-72.
- Fully isolated high side and low side LIGBTs in junction isolation technology. Proceedings of the International Symposium on Power Semiconductor Devices and ICs, 2006.
- . IEEE Transactions on Electron Devices, 53(6), 1487-1490.
- . IEEE Transactions on Electron Devices, 53(7), 1740-1744.
- . Nanotechnology, 16(10), 2188-2192.
- . IEEE Transactions on Electron Devices, 52(9), 2075-2080.
- . IEEE Transactions on Electron Devices, 52(7), 1672-1676.
- . IEEE Transactions on Electron Devices, 52(11), 2482-2488.
- . IEEE Transactions on Engineering Management, 52(4), 429-439.
- . Materials Research Society Symposium Proceedings, 808, 697-702.
- Advances in power semiconductor devices.. Microelectron. J., 35, 223-223.
- . Microelectronics Journal, 35(3), 305-310.
- . IEE Proceedings: Circuits, Devices and Systems, 151(3), 265-268.
- . Microelectronics Journal, 35(3), 235-248.
- . IEE Proceedings: Circuits, Devices and Systems, 151(3), 203-206.
- . Solid-State Electronics, 48(9), 1655-1660.
- . IEEE Transactions on Electron Devices, 51(8), 1296-1303.
- . Solid-State Electronics, 48(12), 2207-2211.
- . IEEE Transactions on Electron Devices, 51(12), 2223-2228.
- Creativity - A Catalyst for Technological Innovation. IEEE International Engineering Management Conference, 291-295.
- . IEEE Electron Device Letters, 24(11), 701-703.
- . Solid-State Electronics, 47(11), 1937-1941.
- . Phys Rev Lett, 88(8), 085501.
- . Solid-State Electronics, 46(6), 903-909.
- . Solid-State Electronics, 46(2), 255-261.
- . Applied Physics Letters, 80(12), 2192-2194.
- . IEEE Electron Device Letters, 23(12), 725-727.
- . Solid-State Electronics, 45(1), 71-77.
- A comparison of early stage hot carrier degradation behaviour in 5 and 3 V sub-micron low doped drain metal oxide semiconductor field effect transistors.. Microelectron. Reliab., 41, 169-177.
- . Solid-State Electronics, 45(7), 1055-1058.
- . Microelectronics Journal, 32(2), 121-126.
- . Solid-State Electronics, 45(1), 127-132.
- . Physica B: Condensed Matter, 304(1-4), 483-488.
- . Microelectronics Journal, 32(5-6), 527-536.
- . Microelectronics Journal, 32(4), 323-326.
- . Microelectronics Journal, 32(5-6), 481-484.
- A novel trench clustered insulated gate bipolar transistor (TCIGBT). IEEE ELECTR DEVICE L, 21(12), 613-615.
- . Solid-State Electronics, 44(8), 1381-1386.
- . Microelectronics Journal, 31(3), 175-185.
- . Electronics Letters, 36(14), 1242-1244.
- . Electronics Letters, 36(18), 1587-1589.
- . Solid-State Electronics, 44(10), 1869-1873.
- . Solid-State Electronics, 44(7), 1213-1218.
- . Journal of Electronic Materials, 29(8), 1033-1037.
- . International Journal of Electronics, 86(10), 1169-1178.
- . Solid-State Electronics, 43(10), 1845-1853.
- . Physical Review Letters, 83(9), 1799-1801.
- . IEEE Electron Device Letters, 20(11), 580-582.
- . IEEE Electron Device Letters, 20(2), 80-82.
- . Electronics Letters, 35(21), 1880-1881.
- Self-diffusion in silicon. Defect and Diffusion Forum, 153-155, 69-80.
- . Applied Physics Letters, 71(14), 2002-2004.
- . Solid State Phenomena, 55, 51-53.
- . Electronics Letters, 32(12), 1092-1093.
- . Electronics Letters, 31(23), 2045-2047.
- . Thin Solid Films, 270(1-2), 517-521.
- . Microelectronic Engineering, 28(1-4), 451-454.
- . IEEE Electron Device Letters, 15(11), 482-484.
- . IEEE Transactions on Electron Devices, 40(10), 1880-1883.
- . IEEE Electron Device Letters, 13(11), 575-577.
- . IEEE Transactions on Electron Devices, 38(7), 1624-1632.
- . IEEE Transactions on Electron Devices, 38(7), 1612-1618.
- . Solid State Electronics, 34(9), 983-993.
- . IEEE Journal of Solid-State Circuits, 25(2), 613-616.
- . Micromachines, 15(11), 1337-1337.
- . physica status solidi (a).
- Analysis of 1.2kV GaN polarisation superjunction diode surge current capability. Japanese Journal of Applied Physics.
- Investigation on Shift in Threshold Voltages of 1.2kV GaN Polarization Superjunction (PSJ) HFETs. IEEE Transactions on Electron Devices.
- . 1999 Proceedings. 49th Electronic Components and Technology Conference (Cat. No.99CH36299).
- Theoretical Analysis of On-state Performance Limit of 4H-SiC IGBT in Field-Stop Technology. IEEE Transactions on Electron Devices.
- Design of a Snubber Circuit for Low Voltage DC Solid-State Circuit Breakers. IET Power Electronics.
- 3-D Scaling Rules for High Voltage Planar Clustered IGBTs. IEEE Transactions on Electron Devices.
- Evaluation of Gate Drive Circuit Effect in Cascode GaNFET-based Application. Bulletin of the Polish Academy of Sciences : Technical Sciences.
- . IET Power Electronics.
- Analytical Modeling of Sheet Carrier Density and ON-Resistance in Polarization Super-Junction HFETs. IEEE Transactions on Electron Devices.
- Investigation of Turn-on Performance in 1.2-kV MOS-Bipolar Devices. Japanese Journal of Applied Physics.
Conference proceedings papers
- . PCIM Europe Conference Proceedings, Vol. 2024-June (pp 549-556)
- . PCIM Europe Conference Proceedings, Vol. 2024-June (pp 2601-2606)
- . ISPS'23 Proceedings
- . ISPS'23 Proceedings
- . ISPS'23 Proceedings
- . IECON 2021 – 47th Annual Conference of the IEEE Industrial Electronics Society, 13 October 2021 - 16 October 2021.
- . Extended Abstracts of the 2021 International Conference on Solid State Devices and Materials, 6 September 2021 - 9 September 2021.
- . Proceedings of 2021 IEEE 12th Energy Conversion Congress & Exposition - Asia (ECCE-Asia) (pp 1319-1324). Singapore, Singapore, 24 May 2021 - 27 May 2021.
- . 2020 8th International Conference on Power Electronics Systems and Applications (PESA). Hong Kong, China, 7 December 2020 - 7 December 2020.
- (pp 113-115)
- . 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD), 13 September 2020 - 18 September 2020.
- . 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD). Vienne, Austria, 13 September 2020 - 18 September 2020.
- . Proceedings of 2020 IEEE Applied Power Electronics Conference and Exposition (APEC) (pp 686-689). New Orleans, LA, USA, 15 March 2020 - 19 March 2020.
- . Proceedings of 2019 IEEE International Electron Devices Meeting (IEDM). San Francisco, CA, USA, 9 December 2019 - 11 December 2019.
- High dV/dt controllability of 1.2kV TCIGBT through dynamic avalanche elimination. PCIM Asia 2020 - International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management, Proceedings (pp 176-180)
- . 2017 IEEE 26th International Symposium on Industrial Electronics (ISIE), 19 June 2017 - 21 June 2017.
- . 2017 IEEE International Electric Machines and Drives Conference (IEMDC), 21 May 2017 - 24 May 2017.
- . 2017 IEEE 26th International Symposium on Industrial Electronics (ISIE), 19 June 2017 - 21 June 2017.
- Reliability Study and Modelling of IGBT Press-Pack Power Modules. 2017 THIRTY SECOND ANNUAL IEEE APPLIED POWER ELECTRONICS CONFERENCE AND EXPOSITION (APEC) (pp 2711-2717)
- . Japanese Journal of Applied Physics, Vol. 56(4S), 26 September 2016 - 29 September 2016.
- Impact of Poly-Crystalline Diamond within Power Semiconductor Device Modules in a Converter. 2016 IEEE ENERGY CONVERSION CONGRESS AND EXPOSITION (ECCE)
- . 2016 IEEE Energy Conversion Congress and Exposition (ECCE), 18 September 2016 - 22 September 2016.
- . 8th IET International Conference on Power Electronics, Machines and Drives (PEMD 2016)
- . 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD), 10 May 2015 - 14 May 2015.
- . 2015 IEEE Applied Power Electronics Conference and Exposition (APEC), 15 March 2015 - 19 March 2015.
- . 2015 45th European Solid State Device Research Conference (ESSDERC), 14 September 2015 - 18 September 2015.
- A study of fast switching, anode shorted lateral insulated gate bipolar transistor. European Solid-State Device Research Conference (pp 521-524)
- . 2014 International Symposium on Power Electronics, Electrical Drives, Automation and Motion, 18 June 2014 - 20 June 2014.
- . 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD), 15 June 2014 - 19 June 2014.
- . Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 169-172)
- . Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 265-268)
- Evaluation of 1.2kV Super Junction Trench-Gate Clustered Insulated Gate Bipolar Transistor (SJ-TCIGBT). 2011 IEEE 23RD INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD) (pp 92-95)
- GaN Based Super HFETs over 700V Using the Polarization Junction Concept. 2011 IEEE 23RD INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (ISPSD) (pp 280-283)
- . Technical Digest - International Electron Devices Meeting, IEDM
- . Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 164-167)
- . Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 235-238)
- . Proceedings of the IEEE Bipolar/BiCMOS Circuits and Technology Meeting (pp 198-205)
- . 2008 20th International Symposium on Power Semiconductor Devices and IC's, 18 May 2008 - 22 May 2008.
- . Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 48-51)
- An Analysis on Turn-off Behaviour of 1.2kV NPT-CIGBT under Clamped Inductive Load Switching. 2008 13TH INTERNATIONAL POWER ELECTRONICS AND MOTION CONTROL CONFERENCE, VOLS 1-5 (pp 43-47)
- . Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 177-180)
- . Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 57-60)
- . Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 245-248)
- RC-TCIGBT: A reverse conducting trench clustered IGBT. PROCEEDINGS OF THE 19TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES AND ICS (pp 161-164)
- . Technical Digest - International Electron Devices Meeting, IEDM
- Influence of the device layout on the performance of 20A 1.2kV clustered insulated gate bipolar transistor (CIGBT) in PT technology. 2006 INTERNATIONAL SYMPOSIUM ON POWER ELECTRONICS, ELECTRICAL DRIVES, AUTOMATION AND MOTION, VOLS 1-3 (pp 275-278)
- Experimental demonstration of a 1.2kV trench clustered insulated gate bipolar transistor in non punch through technology. PROCEEDINGS OF THE 18TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS (pp 185-188)
- Interaction between monolithically integrated JI-LIGBTs under clamped inductive switching. Proceedings of the International Symposium on Power Semiconductor Devices and ICs (pp 119-122)
- Zero voltage switching of a 1200V PT clustered insulated gate bipolar transistor. PROCEEDINGS OF THE 17TH INTERNATIONAL SYMPOSIUM ON POWER SEMICONDUCTOR DEVICES & ICS (pp 263-266)
- . Proceedings of the 16th International Symposium on Power Semiconductor Devices & IC's, 27 May 2004 - 27 May 2004.
- Potential of high-k dielectrics for lateral power and high voltage devices. Proceedings of the International Conference on Microelectronics, Vol. 24 I (pp 129-132)
- . IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD), Vol. 16 (pp 269-272)
- . IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD), Vol. 16 (pp 241-244)
- Technology strategy - A powerful instrument to generate and sustain competitive advantage in power microelectronics. IEEE International Engineering Management Conference, Vol. 1 (pp 358-362)
- 1.7kV NPT V-groove clustered IGBT - Fabrication and experimental demonstration. IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD) (pp 345-348)
- Human Aspect of Rapid Product Commercialization in Power Microelectronics. IEEE International Engineering Management Conference (pp 247-251)
- Anode-gated MOS controlled thyristor with ultra-fast switching capability. IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD) (pp 299-302)
- Dual gate lateral inversion layer emitter transistor for power and high voltage integrated circuits. IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD) (pp 216-219)
- . Materials Research Society Symposium - Proceedings, Vol. 716 (pp 317-323)
- . ICCDCS 2002 - 4th IEEE International Caracas Conference on Devices, Circuits and Systems
- Influence of physical parameters on the quasi-saturation of a power SOI RF LDMOS. IEEE International Conference on Semiconductor Electronics, Proceedings, ICSE (pp 314-318)
- Advances in devices and technologies for power and high voltage integrated circuits. Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4746 I (pp 422-431)
- Overview of trench gated MOS-Controlled bipolar semiconductor power devices. Proceedings of SPIE - The International Society for Optical Engineering, Vol. 4746 I (pp 444-449)
- . IEE Conference Publication(487) (pp 557-561)
- The investigation into the recent mergers and acquisitions in power semiconductor industry. IEEE International Engineering Management Conference, Vol. 2 (pp 826-830)
- . IEE Proceedings - Circuits, Devices and Systems, Vol. 148(2) (pp 79-79)
- Clustered insulated gate bipolar transistor: a new power semiconductor device. IEE PROCEEDINGS-CIRCUITS DEVICES AND SYSTEMS, Vol. 148(2) (pp 75-78)
- A novel, 1.2 kV trench clustered IGBT with ultra high performance. IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD) (pp 323-326)
- Clustered IGBT - a new power semiconductor device. Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3975
- Novel area efficient edge termination technique for planar, MOS controlled power devices. Proceedings of SPIE - The International Society for Optical Engineering, Vol. 3975
- The radial confinement: A new approach to high voltage lateral power devices. Proceedings of the International Semiconductor Conference, CAS, Vol. 1 (pp 349-352)
- A novel, clustered insulated gate bipolar transistor for high power applications. Proceedings of the International Semiconductor Conference, CAS, Vol. 1 (pp 173-181)
- Self-interstitial clusters in silicon. Materials Research Society Symposium - Proceedings, Vol. 610
- Resurfed lateral bipolar transistors for high-voltage, High-frequency applications. IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD) (pp 185-187)
- . Materials Research Society Symposium - Proceedings, Vol. 609
- Influence of the N plus floating emitter on the on-state characteristics of the trench EST. 2000 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, CAS 2000 PROCEEDINGS (pp 329-332)
- The trench planar insulated gate bipolar transistor (TPIGBT). IEE Colloquium (Digest)(104) (pp 75-79)
- . Materials Research Society Symposium - Proceedings, Vol. 557 (pp 635-640)
- . MRS Proceedings, Vol. 508
- . MRS Proceedings, Vol. 507
- . MRS Proceedings, Vol. 467
- Semi-insulating layer for novel high voltage polysilicon thin film transistors. Materials Research Society Symposium - Proceedings, Vol. 377 (pp 731-736)
- (pp 605-608)
- A study of fast switching, anode shorted lateral insulated gate bipolar transistor. European Solid-State Device Research Conference (pp 521-524)
- Influence of lattice temperature on SOI MOSFET's output characteristics. IEE Colloquium (Digest)(64)
- A New Generation of Clustered IGBT with High Ruggedness. PCIM. Shanghai, 25 June 2015 - 25 June 2015.
- . 2006 IEEE International Symposium on Power Semiconductor Devices & IC's
- . 2006 IEEE International Symposium on Power Semiconductor Devices & IC's
- . Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005.
- . Proceedings of the 14th International Symposium on Power Semiconductor Devices and Ics
- . Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614)
- . 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)
- . 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)
- . 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595)
- . 12th International Symposium on Power Semiconductor Devices & ICs. Proceedings (Cat. No.00CH37094)
- . 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059)
- . 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312)
- . CAS '99 Proceedings. 1999 International Semiconductor Conference (Cat. No.99TH8389)
- . CAS '99 Proceedings. 1999 International Semiconductor Conference (Cat. No.99TH8389)
- . CAS '99 Proceedings. 1999 International Semiconductor Conference (Cat. No.99TH8389)
- . CAS '99 Proceedings. 1999 International Semiconductor Conference (Cat. No.99TH8389)
- . International Electron Devices Meeting 1998. Technical Digest (Cat. No.98CH36217)
- . Proceedings of the 10th International Symposium on Power Semiconductor Devices and ICs. ISPSD'98 (IEEE Cat. No.98CH36212)
- . Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's
- . Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's
- . Proceedings of Second International Conference on Power Electronics and Drive Systems
- . Proceedings of International Symposium on Power Semiconductor Devices and IC's: ISPSD '95
- . [1993] Proceedings of the 5th International Symposium on Power Semiconductor Devices and ICs
- . Proceedings of the 4th International Symposium on Power Semiconductor Devices and Ics
- . [1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs
- . [1991] Proceedings of the 3rd International Symposium on Power Semiconductor Devices and ICs
- . Proceedings of the 2nd International Symposium on Power Semiconductor Devices and Ics. ISPSD '90.
- International Symposium on Power Semiconductors & ICs. International Symposium on Power Semiconductors and ICs
Preprints
- Professional activities and memberships
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- Rolls-Royce/Royal Academy of Engineering Research Chair