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Edited books

• (Ed.) (2015) . IOP Publishing.
• Walther T & Hutchison JL (Ed.) (2013) 18th International Conference on Microscopy of Semiconducting Materials. Bristol: Institute of Physics Publishing.
• Walther T & Midgley PA (Ed.) (2011) 17th International Conference on Microscopy of Semiconducting Materials. Bristol: IOP Publishing.
• Walther T, Nellist PD, Hutchinson JL & Cullis AG (Eds.) (2010) . Bristol: IOP Publishing.

Journal articles

• Guo R & Walther T (2024) . Journal of Microscopy, 293.
• Walther T (2024) . Applied Research, 3(4-5).
• Ma Z, Zhang X, Liu P, Deng Y, Hu W, Chen L, Zhu J, Chen S, Wang Z, Shi Y , Ma J et al (2023) . Applied Physics Letters, 123(10).
• Walther T (2022) . Nanomaterials, 12(21).
• Walther T (2022) . Nanomaterials, 12(13).
• Walther T, Wolf F, Recnik A & Mader W (2022) . International Journal of Materials Research, 97(7), 934-942.
• Zhong W & Walther T (2022) . Electronics, 11(1), 48-48.
• Walther T (2021) . Nanomaterials, 11(8).
• Walther T, Calahorra Y & Massabuau F (2020) . Semiconductor Science and Technology, 35(12).
• Walther T (2019) . Nanomaterials, 9(6).
• Wang X, Bai J & Walther T (2018) . Journal of Microscopy, 272(2), 111-122.
• Dimitrakopulos G, Walther T, Pinna C & Le Bourhis E (2018) . Materials Science and Technology (United Kingdom), 34(13), 1529-1530.
• Norris DJ & Walther T (2018) . Materials Science and Technology.
• Walther T (2018) . Nanotechnology, 29(31), 318001-318001.
• WALTHER T & KRYSA AB (2017) . Journal of Microscopy, 268(3), 298-304.
• Walther T & Jones L (2017) . J Microsc, 268(3), 221-224.
• NORRIS DJ, MYRONOV M, LEADLEY DR & WALTHER T (2017) . Journal of Microscopy, 268(3), 288-297.
• WANG X, CHAUVAT M-P, RUTERANA P & WALTHER T (2017) . Journal of Microscopy, 268(3), 248-253.
• Angadi VC, Benz F, Tischer I, Thonke K, Aoki T & Walther T (2017) . Applied Physics Letters, 110(22).
• Walther T, Wang X, Angadi VC, Ruterana P, Longo P & Aoki T (2017) . Journal of Materials Research, 32(5), 983-995.
• Walther T, Dunin-Borkowski RE, Rouvière J-L & Stach EA (2017) . Journal of Materials Research, 32(5), 911-911.
• Wang X, Chauvat M-P, Ruterana P & Walther T (2016) . MRS Advances, 1(40), 2749-2756.
• Walther T & Wang X (2016) . Journal of Microscopy, 262(2), 151-156.
• Angadi VC, Abhayaratne C & Walther T (2016) . Journal of Microscopy, 262(2), 157-166.
• Walther T & Beanland R (2016) . Journal of Microscopy, 262(2), 131-133.
• PARRI MC, QIU Y & WALTHER T (2015) . Journal of Microscopy, 260(3), 427-441.
• Bazioti C, Papadomanolaki E, Kehagias T, Walther T, Smalc-Koziorowska J, Pavlidou E, Komninou P, Karakostas T, Iliopoulos E & Dimitrakopulos GP (2015) . Journal of Applied Physics, 118(15), 155301-155301.
• Kehagias T, Florini N, Kioseoglou J, Pavloudis T, Komninou P, Walther T, Moratis K, Hatzopoulos Z & Pelekanos NT (2015) . Semiconductor Science and Technology, 30(11), 114012-114012.
• Wang X, Chauvat MP, Ruterana P & Walther T (2015) . Semiconductor Science and Technology, 30(11).
• Walther T (2015) . physica status solidi (c), 12(3), 310-313.
• WALTHER T (2015) . Journal of Microscopy, 257(3), 171-178.
• Walther T & Krysa AB (2015) . Crystal Research and Technology, 50(1), 62-68.
• WALTHER T (2015) . Journal of Microscopy, 257(2), 87-91.
• Walther T, Richards RD & Bastiman F (2015) . Crystal Research and Technology, 50(1), 38-42.
• Walther T, Hopkinson M, Daneu N, Recnik A, Ohno Y, Inoue K & Yonenaga I (2014) . Journal of Materials Science, 49(11), 3898-3908.
• Norris DJ, Qiu Y, Dobbie A, Myronov M & Walther T (2014) . Journal of Applied Physics, 115(1).
• Walther T & Ross IM (2013) Aberration corrected high-resolution transmission and scanning transmission electron microscopy of thin perovskite layers. Physics Procedia, 40, 49-55.
• Makhonin MN, Foster AP, Krysa AB, Fry PW, Davies DG, Grange T, Walther T, Skolnick MS & Wilson LR (2013) . Nano Lett, 13(3), 861-865.
• Walther T, Amari H, Ross IM, Wang T & Cullis AG (2013) . Journal of Materials Science, 48, 2883-2892.
• Walther T, Norris DJ, Qiu Y, Dobbie A, Myronov M & Leadley DR (2013) The Stranski-Krastanow transition in SiGe epitaxy investigated by scanning transmission electron microscopy. Physica Status Solidi. A: Applications and Materials Science (Print), 210(1), 187-190.
• Moebus G, Walther T, Brydson R, Ozkaya D, MacLaren I, Donnelly S, Nellist P, Li Z, Baker R & Chiu Y (2012) . Journal of Physics: Conference Series, 371, 011001-011001.
• Amari H, Ross IM, Wang T & Walther T (2012) . Physica Status Solidi (C) Current Topics in Solid State Physics, 9(3-4), 546-549.
• Amari H, Kappers MJ, Humphreys CJ, Cheze C & Walther T (2012) . Physica Status Solidi. C: Current Topics in Solid State Physics, 9(3-4), 1079-1082.
• Walther T & Midgley PA (2011) . Journal of Physics: Conference Series, 326, 011001-011001.
• Butkus M, Robertson G, Maker G, Malcolm G, Hamilton C, Krysa AB, Stevens BJ, Hogg RA, Qiu Y, Walther T & Rafailov EU (2011) . IEEE PHOTONIC TECH L, 23(21), 1603-1605.
• Krysa AB, Revin DG, Commin JP, Atkins CN, Kennedy K, Qiu Y, Walther T & Cockburn JW (2011) . IEEE PHOTONIC TECH L, 23(12), 774-776.
• Revin DG, Kennedy K, Commin JP, Qiu Y, Walther T, Cockburn JW & Krysa AB (2011) . Electronics Letters, 47(9), 559-561.
• Amari H, Lari L, Zhang HY, Geelhaar L, Cheze C, Kappers MJ, McAleese C, Humphreys CJ, Walther T & IOP (2011) . 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, 326.
• Parri MC, Walther T & IOP (2011) . 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, 326.
• Amari H, Zhang HY, Geelhaar L, Cheze C, Kappers MJ, Walther T & IOP (2011) . 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, 326.
• Bastiman F, Qiu Y, Walther T & IOP (2011) . 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, 326.
• Nguyen VH, Dobbie A, Myronov M, Norris DJ, Walther T & Leadley DR (2011) Epitaxial growth of relaxed germanium layers by reduced pressure chemical vapour deposition on (110) and (111) silicon substrates. Thin Solid Films.
• Walther T, England J & IOP (2011) . 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, 326.
• Lari L, Walther T, Gass MH, Geelhaar L, Chèze C, Riechert H, Bullough TJ & Chalker PR (2011) Direct observation by transmission electron microscopy of the influence of Ni catalyst-seeds on the growth of GaN-AlGaN axial heterostructure nanowires. Journal of Crystal Growth.
• Baker R (2010) . Journal of Physics: Conference Series, 241, 011001-011001.
• Lari L, Amari H, Walther T, Bai J, Wang T & Cullis AG (2010) . Journal of Physics: Conference Series, 241.
• Walther T (2010) . Journal of Physics: Conference Series, 241.
• Hurst AC, Edo TB, Walther T, Sweeney F & Rodenburg JM (2010) . Journal of Physics: Conference Series, 241.
• Griffiths AJV & Walther T (2010) . Journal of Physics: Conference Series, 241.
• Qiu Y, Zhang ZY, Hogg RA, Cullis AG & Walther T (2010) . Journal of Physics: Conference Series, 241.
• Qiu Y, Zhang Y, Hogg A, Cullis G & Walther T (2010) . Journal of Physics: Conference Series, 209.
• Walther T, Qiu Y & Cullis AG (2010) . Journal of Physics: Conference Series, 241.
• Lari L, Walther T, Black K, Murray RT, Bullough TJ, Chalker PR, Chèze C, Geelhaar L & Riechert H (2010) . Journal of Physics: Conference Series, 209.
• Walther T & Hopkinson M (2010) . Journal of Physics: Conference Series, 209.
• Norris DJ, Walther T, Cullis AG, Myronov M, Dobbie A, Whall T, Parker EHC, Leadley DR, De Jaeger B, Lee W , Meuris M et al (2010) . Journal of Physics: Conference Series, 209.
• Walther T (2010) . Journal of Physics: Conference Series, 209.
• Liu C, Walther T & Rodenburg JM (2009) . Ultramicroscopy, 109(10), 1263-1275.
• Liu HY, Qiu Y, Jin CY, Walther T & Cullis AG (2008) . APPL PHYS LETT, 92(11).
• Fojtik A, Muschik T, Walther T & Giersig M (2007) . Zeitschrift fur Physikalische Chemie, 221(3), 377-386.
• Walther T, Wolf F, Recnik A & Mader W (2006) . International Journal of Materials Research, 97(7), 934-942.
• Peng ZQ, Spliethoff B, Tesche B, Walther T & Kleinermanns K (2006) . The Journal of Physical Chemistry Part B, 110(6), 2549-2554.
• Rumpf H, Walther T, Zamponi C & Quandt E (2006) . MAT SCI ENG A-STRUCT, 415(1-2), 304-308.
• Roth SV, Walter H, Burghammer M, Riekel C, Lengeler B, Schroer C, Kuhlmann M, Walther T, Sehrbrock A, Domnick R & Müller-Buschbaum P (2006) . Applied Physics Letters, 88(2), 1-3.
• Groudeva-Zotova S, Karl H, Savan A, Feydt J, Wehner B, Walther T, Zotov N, Stritzker B & Ludwig A (2006) . Thin Solid Films, 495(1-2), 169-174.
• Walther T (2006) . Journal of Microscopy, 223(2), 165-170.
• Walther T (2006) . Journal of Microscopy, 221(2), 137-144.
• Zotov N, Feydt J, Walther T & Ludwig A (2006) . Applied Surface Science, 253(1 SPEC. ISS.), 128-132.
• Walther T, Quandt E, Stegmann H, Thesen A & Benner G (2006) . Ultramicroscopy, 106(11-12 SPEC. ISS.), 963-969.
• Walther T, Rečnik A & Daneu N (2006) . Microchimica Acta, 155(1-2), 313-318.
• Walther T & Stegmann H (2006) . Microscopy and Microanalysis, 12(6), 498-505.
• Jungk T, Walther T & Mader W (2005) . Ultramicroscopy, 104(3-4), 206-219.
• Peng ZQ, Walther T & Kleinermanns K (2005) . The Journal of Physical Chemistry Part B, 109(33), 15735-15740.
• Walther T (2005) . International Journal of Materials Research, 96(5), 429-437.
• Peng ZQ, Walther T & Kleinermanns K (2005) . Langmuir, 21(10), 4249-4253.
• Walther T (2005) . Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques, 96(5), 429-437.
• Simon J, Walther T, Mader W, Klein J, Reisinger D, Alff L & Gross R (2004) . Applied Physics Letters, 84(19), 3882-3884.
• Barf J, Walther T & Mader W (2004) . Interface Science, 12(2-3), 213-226.
• Walther T, Daneu N & Recnik A (2004) . Interface Science, 12(2-3), 267-275.
• Walther T (2004) . Journal of Microscopy, 215(2), 191-202.
• Daneu N, Rečnik A, Walther T & Mader W (2003) . Microscopy and Microanalysis, 9(S03), 286-287.
• Simon J, Walther T & Mader W (2003) . Microscopy and Microanalysis, 9(SUPPL. 3), 268-269.
• Pack A, Hoernes S, Walther T & Bross R (2003) . European Journal of Mineralogy, 15(1), 193-205.
• Walther T (2003) . Ultramicroscopy, 96(3-4), 401-411.
• Lutsenko EV, Yablonskii GP, Pavlovskii VN, Zubialevich VZ, Gurskii AL, Kalisch H, Heime K, Jansen RH, Walther T, Schineller B & Heuken M (2003) . Physica Status Solidi (A) Applied Research, 195(1 SPEC), 188-193.
• Daneu N, Rečnik A, Walther T & Mader W (2003) . Microscopy and Microanalysis, 9(SUPPL. 3), 286-287.
• Jungk T, Walther T & Mader W (2003) . Microscopy and Microanalysis, 9(SUPPL. 3), 152-153.
• Philipp B, Majewski P, Alff L, Erb A, Gross R, Graf T, Brandt S, Simon J, Walther T, Mader W , Topwal D et al (2003) . Physical Review B - Condensed Matter and Materials Physics, 68(14).
• Hassdorf R, Feydt J, Thienhaus S, Borowski R, Boese M, Walther T & Moske M (2003) . Materials Research Society Symposium - Proceedings, 785, 57-64.
• Walther T (2003) . Microscopy and Microanalysis, 9(SUPPL. 3), 98-99.
• Cullis AG, Norris DJ, Walther T, Migliorato MA & Hopkinson M (2002) . PHYS REV B, 66(8).
• Philipp JB, Klein J, Recher C, Walther T, Mader W, Schmid M, Suryanarayanan R, Alff L & Gross R (2002) . PHYS REV B, 65(18).
• Barf J, Walther T, Steinecker A & Mader W (2001) . Microscopy and Microanalysis, 7(S2), 290-291.
• Walther T, Cullis AG, Norris DJ & Hopkinson M (2001) . Phys Rev Lett, 86(11), 2381-2384.
• Rečnik A, Daneu N, Walther T & Mader W (2001) . Journal of the American Ceramic Society, 84(11), 2657-2668.
• Pidun M, Karduck P, Mayer J, Heime K, Schineller B & Walther T (2001) . Applied Surface Science, 179(1-4), 213-221.
• Marko IP, Lutsenko EV, Yablonskii GP, Gurskii AL, Kalisch H, Heime K, Heuken M & Walther T (2001) Thermal Stability of ZnMgSSe/ZnSe Laser Heterostructures. Physica Status Solidi (A) Applied Research, 185(2), 301-308.
• Walther T (2001) . Physica B: Condensed Matter, 308-310, 1161-1164.
• Walther T, Cullis AG, Norris DJ & Hopkinson M (2001) The nature of islanding in the InGaAs/GaAs epitaxial system. Materials Research Society Symposium - Proceedings, 648, P1261-P1266.
• Charai A, Walther T, Alfonso C, Zahra AM & Zahra CY (2000) Coexistence of clusters, GPB zones, S ''-, S '- and S-phases in an Al-0.9% Cu-1.4% Mg alloy. ACTA MATER, 48(10), 2751-2764.
• Walther T, Kalisch H, Heime K, Heuken M, Marko I & Yablonskii GP (2000) Study of sulphur diffusion in ZnMgSSe/ZnSe quantum wells by energy-loss imaging in a transmission electron microscope. Physica Status Solidi (A) Applied Research, 180(1), 351-356.
• Walther T (2000) . Diffusion and Defect Data. Pt A Defect and Diffusion Forum, 183, 53-60.
• Walther T & Marty A (1999) . Philosophical Magazine Letters, 79(1), 31-39.
• Walther T & Humphreys CJ (1999) . Journal of Crystal Growth, 197(1-2), 113-128.
• Molina SI & Walther T (1997) . Thin Solid Films, 307(1-2), 6-9.
• Walther T, Humphreys CJ & Cullis AG (1997) Observation of vertical and lateral Ge segregation in thin undulating SiGe layers on Si by electron energy-loss spectroscopy. APPL PHYS LETT, 71(6), 809-811.
• Walther T, Humphreys CJ & Robbins DJ (1997) . Defect and Diffusion Forum, 143-147, 1135-1140.
• Walther T (1996) . PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 354(1719), 2709-2711.
• Yan Y, Liang W, Walther T & Stobbs W (1996) . Physical Review B - Condensed Matter and Materials Physics, 54(22), 16234-16237.
• WALTHER T, HUMPHREYS CJ, GRIMSHAW MP & CHURCHILL AC (1995) DETECTION OF RANDOM ALLOY FLUCTUATIONS IN HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROGRAPHS OF A1GAAS. PHILOS MAG A, 72(4), 1015-1030.
• Walther T, Humphreys CJ, Cullis AG & Robbins DJ (1995) Correlation between compositional fluctuations and surface undulations in strained layer epitaxy. Materials Science Forum, 196-201(pt 1), 505-510.
• Walther T & Gerthsen D (1993) . Applied Physics A Solids and Surfaces, 57(5), 393-400.
• Gong T, Chen L, Wang X, Qiu Y, Liu H, Yang Z & Walther T () . Crystals, 15(2), 192-192.
• Dong J, Bai H, Deng Y, Liu S, Wang X, Qiu Y, Shi Y & Walther T () . Journal of Physics D: Applied Physics.
• Walther T & Oliver RA () . Journal of Microscopy.
• Liu S, Dong J, Ma Z, Hu W, Deng Y, Shi Y, Wang X, Qiu Y & Walther T () . Journal of Microscopy.
• Walther T () . Materials, 16(17), 5761-5761.
• Deng Y, Xie N, Hu W, Ma Z, Xu F, Chen L, Qiu W, Zhao L, Tao H, Wu B , Huang Y et al () . ACS Applied Nano Materials.
• Walther T, Nutter J, Reithmaier JP & Pavelescu EM () . Semiconductor Science and Technology.

Chapters

• Angadi VC, Abhayaratne C & Walther T (2023) , Encyclopedia of Materials: Electronics (pp. V3-605-V3-618).
• Walther T (2017) , Microscopy Methods in Nanomaterials Characterization (pp. 105-134). Elsevier
• Zhang H & Walther T (2013) In Wang ZM (Ed.), FIB Nanostructures (pp. 299-314). Cham, Switzerland: Springer.
• Walther T (2007) High Spatial and High Energy Resolution Electron Energy-Loss Spectroscopy in a Transmission Electron Microscope: Fundamentals and Applications to Nanostructured Materials In Festkörperforschung FJIF, Urban K, Schneider CM, Bruckel T, Blugel S, Tillmann K, Schweika W, Lentzen M & Baumgarten L (Ed.), Probing the Nanoworld (pp. E1.1-E1.30). Juelich: Forschungszentrum Juelich GmbH.
• Angadi V, Abhayaratne G & Walther T () Automated EELS core-loss edge detection for quantification of the chemical composition of nano-structured semiconductors In NN (Ed.), Elsevier Encyclopedia of Materials Section 2: Nanoscale Materials for Electronics Elsevier

Conference proceedings papers

• Walther T (2019) . Journal of Physics: Conference Series, Vol. 1190(1). Thessaloniki, Greece, 24 June 2018 - 29 June 2018.
• Angadi VC & Walther T (2016) (pp 891-892)
• Walther T & Wang X (2015) . Journal of Physics: Conference Series, Vol. 644 (pp 012006-012006)
• Angadi VC, Abhayaratne & Walther T (2015) . http://www.mmc2015.org.uk/ (pp P.4027-P.4027). Manchester, 29 June 2015 - 2 July 2015.
• Wang X, Chauvat MP, Ruterana P & Walther T (2015) Determination of indium concentration of InGaN alloys from plasmon spectroscopy. MMC2015, Manchester, UK
• Angadi VC & Walther T (2014) . abstract booklet online(poster #3) (pp 13-13). Coventry, 15 October 2014 - 16 October 2014.
• Dimitrakopulos GP, Kioseoglou J, Florini N, Komninou P, Walther T, Morakis K, Hatzopoulos Z, Pelekanos NT & Kehagias T (2014) Nanostructure properties of GaAs/AlGaAs core-shell nanowires. abstract booklet(B-B-II-28). Warsaw, 15 September 2014 - 18 September 2014.
• Dimitrakopulos GP, Florini N, Kioseoglou J, Walther T, Germanis S, Hatzopoulos Z, Pelekanos NT & Kehagias T (2014) Morphology and misfit accommodation of InAs quantum dots on non-singular (211)B GaAs surfaces. abstract booklet(B-B-I-15). Warsaw, 15 September 2014 - 18 September 2014.
• Bazioti C, Dimitrakopulos GP, Kehagias T, Walther T, Papadomanolaki E & Iliopoulos E (2014) Quantitative transmission electron microscopy of high alloy content InGaN deposited by PAMBE: from epilayers to quantum wells. H-2-4(abstract booklet). Warsaw, 15 September 2014 - 18 September 2014.
• Walther T (2014) Comparison of the silicon/phosphorus ratio in natural and synthetic nagelschmidtite for possible use as standard for microanalysis based on X-ray lines of Si and P. 18th Int. Microscopy Congress (IMC2014), Vol. Instrumentation & Techniques (IT-5-P-3376) (pp 616-617). Prague, 7 September 2014 - 12 September 2014.
• Walther T (2014) Investigation of the optical properties of silica nano-particles with low refractive index by electron energy-loss spectroscopy. Microscience Microscopy Congress MMC 2014 (pp P1059-P1059). Manchester, 30 June 2014 - 3 July 2014.
• Zhang H, Ross IM, Zhang S & Walther T (2014) Production of regular quantum dot arrays by focused ion beams. 8th Int. Conf. Quantum Dots (pp 135-135). Pisa, 11 May 2014 - 16 May 2014.
• Florini N, Kioseoglou J, Dimitrakopulos GP, Walther T, Hatzopoulos Z, Pelekanos NT & Kehagias T (2014) qHRTEM analysis of the (211)B In(Ga)As QDs/GaAs heterostucture. 18th Int. Microscopy Congress (IMC2014), Vol. Materials Science MS-1-P-2977 (pp 2340-2341). Prague, 7 September 2014 - 12 September 2014.
• Bazioti C, Kehagias T, Walther T, Papadomanolaki E, Iliopoulos E & Dimitrakopulos GP (2014) Strain relaxation of high-In content InGaN epilayers grown by PAMBE. 18th Int. Microscopy Congress (IMC2014), Vol. MS-14-O-2233 (pp 3714-3715). Prague, 7 September 2014 - 12 September 2014.
• Walther T (2014) Approaches for quantifying hyperspectral images of interfaces in analytical scanning transmission electron microscopy. Int. Conf. on Electron Microscopy & 35th Annual Meeting of EMSI (pp 63-64). Delhi, 9 July 2014 - 11 July 2014.
• Kehagias T, Florini N, Walther T, Moratis K, Hatzopoulos Z & Pelekanos NT (2014) Core-shell GaAs/AlGaAs nanowires grown on Si(111). 18th Int. Microscopy Congress (IMC2014), Vol. Materials Science MS-1-O-2638 (pp 2185-2186). Prague, 7 September 2014 - 12 September 2014.
• Ross IM, Li W & Walther T (2014) . Journal of Physics: Conference Series, Vol. 522(1)
• Walther T (2013) Nanoparticle characterisation by advanced transmission electron microscopy: chemical identification, local spectroscopy, mapping and detection limits. 1st International Symposium on Profiling 2013(Book of Abstracts) (pp 103-103). Portugal, 2 September 2013 - 4 September 2013.
• Benz F, Walther T & Strunk HP (2013) . Journal of Physics: Conference Series, Vol. 471 (pp 012032-1-012032-4). Bristol, 7 April 2013 - 11 April 2013.
• Zhang H, Ross IM & Walther T (2013) . Journal of Physics: Conference Series, Vol. 471 (pp 012047-1-012047-4). Bristol, 7 April 2013 - 11 April 2013.
• Taghi Khani A & Walther T (2013) . Journal of Physics: Conference Series, Vol. 471 (pp 012037-1-012037-4). Bristol, 7 April 2013 - 11 April 2013.
• Qiu Y, Nguyen VH, Dobbie A, Myronov M & Walther T (2013) . Journal of Physics: Conference Series, Vol. 471 (pp 012031-1-012031-6). Bristol, 7 April 2013 - 11 April 2013.
• Lari L, Ross IM, Walther T, Black K, Cheze C, Geelhaar L, Riechert H & Chalker PR (2013) . Journal of Physics: Conference Series, Vol. 471 (pp 012039-1-012039-4). Bristol, 7 April 2013 - 11 April 2013.
• Qiu Y, Norris DJ & Walther T (2012) Calibration of thickness-dependent k-factors of Germanium X-ray lines for improved analytical transmission electron microscopy of SiGe layers. 15th European Microscopy Congress, Vol. 2(Physical Sciences: Tools and Techniques) (pp 643-644). Oxford, 16 September 2012 - 21 September 2012.
• Walther T (2012) Simultaneous imaging of single gold atoms and lattice fringes of nano-particles in annular dark-field scanning transmission electron microscopy. 15th European Microscopy Congress, Vol. 2(Physical Sciences: Tools and Techniques) (pp 397-398). Oxford, 16 September 2012 - 21 September 2012.
• Parri MC, Qiu Y & Walther T (2012) Comparing experiment with theory of X-ray absorption in thin SiGe films. 15th European Microscopy Congress, Vol. 2(Physical Sciences: Tools and Techniques) (pp 693-694). Oxford, 16 September 2012 - 21 September 2012.
• Parri MC & Walther T (2012) Determining sample thickness in transmission electron microscopy using X-ray line intensity ratios. 15th European Microscopy Congress, Vol. 2(Physical Sciences: Tools and Techniques) (pp 645-646). Oxford, 16 September 2012 - 21 September 2012.
• Norris DJ, Dobbie A, Myronov M, Leadley DR, Parker EHC & Walther T (2012) Surface roughening of chemical vapour deposited SiGe layers. 15th European Microscopy Congress, Vol. 1(Physical Sciences: Applications) (pp 933-934). Oxford, 16 September 2012 - 21 September 2012.
• Zhang H, Ross IM, Hopkinson M, Zhang S & Walther T (2012) Quantum dot nucleation on focused ion beam patterned GaAs substrates. 15th European Microscopy Congress, Vol. 1(Physical Sciences: Applications) (pp 927-928). Oxford, 16 September 2012 - 21 September 2012.
• Zhang, H , Ross, IM , Hopkinson, M , Zhang, S & Walther, T (2012) Study of controlled quantum dot formation on focused ion beam patterned GaAs substrates. IEEE-Nano2012, Vol. digital abstract booklet (pp 716-718). London, 20 August 2012 - 23 August 2012.
• Ross IM, Kawazu M, Sawada H, Papworth A & Walther T (2012) Performance of a cold field-emission gun double aberration corrected TEM/STEM at 80kV. Journal of Physics: Conference Series, Vol. 371 (pp 012013)
• Ross IM & Walther T (2012) Configuring a 300kV cold field-emission gun for optimum analytical performance. Journal of Physics: Conference Series, Vol. 371 (pp 012012)
• Amari H, Ross IM, Wang T & Walther T (2012) Characterization of thickness, elemental distribution and band-gap properties in AlGaN/GaN quantum wells by aberration-corrected TEM/STEM. Journal of Physics: Conference Series, Vol. 371 (pp 012014)
• Parri MC & Walther T (2012) . Journal of Physics: Conference Series, Vol. 371 (pp 012063-1-012063-4). Birmingham, UK, 6 September 2011 - 9 September 2011.
• Norris DJ, Ross IM, Dobbie A, Myronov M, Whall TE, Parker EHC, Leadley DR, Walther T & IOP (2011) . 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, Vol. 326
• Qiu Y, Lari L, Ross IM, Walther T & IOP (2011) . 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, Vol. 326
• Ross IM, Norris DJ, De Jaeger B, Lee W, Meuris M, Walther T & IOP (2011) . 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011, Vol. 326
• Revin DG, Atkins CN, Commin JP, Cockburn JW, Qiu Y, Walther T, Kennedy K & Krysa AB (2011) Room temperature GaAs/AlGaAs quantum cascade lasers with InGaP and InAlP waveguides. Optics InfoBase Conference Papers
• Schmid HK, Irsen S & Walther T (2010) ELNES fine structure of transition metal oxides recorded by HR-EELS. Past, Present and Future of (S)TEM and its Applications (pp 51-51). Paris, 9 June 2010 - 11 June 2010.
• Qiu Y, Krysa AB & Walther T (2010) . Journal of Physics: Conference Series, Vol. 245 (pp 012087). Nottingham
• Norris DJ, Ross IM, Cullis AG, Walther T, Myronov M, Dobbie A, Whall T, Parker EHC, Leadley DR, De Jaeger B , Lee W et al (2010) . Journal of Physics: Conference Series, Vol. 241
• Walther T (2008) . EMC2008- 14th European Microscopy Congress, Vol. 2 (Materials Science) (pp 375-376). Berlin, 1 September 2008 - 5 September 2008.
• Walther T (2008) Comparison of transmission electron microscopy mehods to measure layer thicknesses to sub-monolyer precision. EMC2008- 14th European Microscopy Congress, Vol. 2 (Materials Science) (pp 377-378). Berlin, 1 September 2008 - 5 September 2008.
• Walther T & Stegmann H (2008) . EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 65-66). Berlin, 1 September 2008 - 5 September 2008.
• Walther T, Atkinson K, Sweeney F & Rodenburg JM (2008) . EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 165-166). Berlin, 1 September 2008 - 5 September 2008.
• Liu C, Walther T & Rodenburg JM (2008) . EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 723-724). Berlin, 1 September 2008 - 5 September 2008.
• Walther T (2008) A comparison of transmission electron microscopy methods to measure wetting layer thicknesses to sub-monolayer precision - art. no. 012091. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, Vol. 126 (pp 12091-12091)
• Walther T (2008) A simple method to improve the quantification accuracy of energy-dispersive X-ray microanalysis - art. no. 012090. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, Vol. 126 (pp 12090-12090)
• Liew SL, Walther T, Irsen S, Hopkinson M, Skolnick MS & Collis AG (2008) Investigating the Capping of InAs Quantum Dots by InGaAs. MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, Vol. 120 (pp 259-262)
• Qiu Y, Walther T, Liu HY, Jin CY, Hopkinson M & Cullis AG (2008) Comparing InGaAs and GaAsSb Metamorphic Buffer Layers on GaAs Substrates for InAs Quantum Dots Emitting at 1.55 mu m. MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, Vol. 120 (pp 263-268)
• Ross IM, Gass M, Walther T, Bleloch A, Cullis AG, Lever L, Ikonic Z, Califano M, Kelsall RW, Zhang J & Paul DJ (2008) Structural and Compositional Properties of Strain-Symmetrized SiGe/Si Heterostructures. MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, Vol. 120 (pp 269-272)
• Walther T (2008) Quantifying the Top-Bottom Effect in Energy-Dispersive X-Ray Spectroscopy of Nanostructures Embedded in Thin Films. MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, Vol. 120 (pp 185-188)
• Walther T (2008) Determining Buried Wetting Layer Thicknesses to Sub-Monolayer Precision by Linear Regression Analysis of Series of Spectra. MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, Vol. 120 (pp 247-250)
• Schmid H, Walther T & Stegmann H (2006) Mn-L ELNES fine structure recorded by high energy-resolution EELS. 16th International Microscopy Congress, Vol. 2 (Instrumentation) (pp 846-846). Sapporo, 3 September 2006 - 8 September 2006.
• Walther T, Quandt E, Greve H & Faupel F (2006) Energy-dispersive x-ray mapping with a new monochromatic and aberration-corrected 200kV field-emission scanning transmission electron microscope. 16th International Microscopy Congress, Vol. 2 (Instrumentation) (pp 873-873). Sapporo, 3 September 2006 - 8 September 2006.
• Walther T, Sehrbrock A & Quandt E (2006) Analysis of focused ion beam cut profiles by transmission electron microscopy. 16th International Microscopy Congress, Vol. 2 (Instrumentation) (pp 1112-1112). Sapporo, 3 September 2006 - 8 September 2006.
• Walther T & Stegmann H (2006) Performance evaluation of a new monochromatic and aberration-corrected 200kV field-emission scanning transmission electron microscope. 16th International Microscopy Congress, Vol. 2 (Instrumentation) (pp 607-607). Sapporo, 3 September 2006 - 8 September 2006.
• Walther T, Schmid H & Stegmann H (2006) Electron energy-loss spectroscopy at 0.1-0.2eV resolution in a new monochromatic and aberration-corrected 200kV field-emission scanning transmisssion electron microscope. 16th International Microscopy Congress, Vol. 2 (Instrumentation) (pp 833-833). Sapporo, 3 September 2006 - 8 September 2006.
• Walther T, Daneu N & Recnik A (2005) New methods for the quantitative chemical study of planar defects and interfaces by transmission electron microscopy. 7th Multinational Congress on Microscopy (MCM2005) (pp 75-78). Ljubljana, 26 June 2005 - 30 June 2005.
• Stegmann H, Walther T, Quandt E, Zschech E & Schmeisser D (2005) High resolution ELNES characterization of chemical bonding in low-dielectric constant materials for interconncet isolation. Microscopy Congress 2005 (pp 238-238). Davos
• Walther T, Recnik A & Daneu N (2005) ConceptEM: a new method to quantify solute segregation to interfaces or planar defect structures by analytical TEM and applications to inversion domain boundaries in doped zinc oxide. Microscopy of Semiconducting Materials, Vol. 107 (pp 199-202)
• Cullis AG, Norris DJ, Walther T, Migliorato MA & Hopkinson M (2005) The mechanism of the Stranski-Krastanov transition. Quantum Dots: Fundamentals, Applications, and Frontiers, Vol. 190 (pp 71-88)
• Daneu N, Walther T & Recnik A (2004) Application of a new method for measuring small amounts of dopants at planar faults: tin-rich inversion boundaries in zinc oxide. 13th European Microscopy Congress (EMC 2004), Vol. 3 (pp 63-64). Herentals, 22 August 2004 - 27 August 2004.
• Simon J, Walther T & Mader W (2004) Diffusion and segregation effects in doped manganite/titanate thin film structures. 13th European Microscopy Congress (EMC 2004), Vol. 2 (Materials Sciences) (pp 243-244). Herentals, 22 August 2004 - 27 August 2004.
• Cullis AG, Norris DJ, O'Neill JP, Ross IM, Migliorato MA, Hopkinson M, Parbrook PJ, Wang T & Walther T (2004) Segregation in compound semiconductors: the Stranski-Krastanow epitaxial transition and electron beam damage processes. 13th European Microscopy Congress (EMC 2004), Vol. 2 (Materials Sciences) (pp 417-418). Herentals, 22 August 2004 - 27 August 2004.
• Walther T (2004) A new way to process and analyse quantitatively series of energy-filtered images of planar structures such as thin films or interfaces. 13th European Microscopy Congress (EMC 2004), Vol. 1 (Instrumentation and Methodology) (pp 251-252). Herentals, 22 August 2004 - 27 August 2004.
• Walther T (2004) The limits of lattice imaging compared to annular dark-field imaging for determining size distributions of nano-particles. 13th European Microscopy Congress (EMC 2004), Vol. 2 (Materials Sciences) (pp 119-120). Herentals, 22 August 2004 - 27 August 2004.
• Walther T (2004) A simple method to determine the chromatic aberration of a transmission electron microscope with imaging energy filter. 13th European Microscopy Congress (EMC 2004), Vol. 1 (Instrumentation and Methodology) (pp 33-34). Herentals, 22 August 2004 - 27 August 2004.
• Jungk T, Walther T & Mader W (2003) . Microscopy and Microanalysis, Vol. 9(Suppl. 3) (pp 152-153). Cambridge, 7 September 2003 - 12 September 2003.
• Walther T (2003) Electron energy loss spectroscopic profiling of semiconductor hetero- and nano-structures: theory, implementation, applications. MICROSCOPY OF SEMICONDUCTING MATERIALS 2003(180) (pp 27-32)
• Mayer J, Pidun M & Walther T (2002) Spectrum imaging studies of ohmic contacts on GaN thin films. 15th International Congress on Electron Microscopy, Vol. 3 (Interdisciplinary) (pp 263-264). Onderstepoort, 1 September 2002 - 6 September 2002.
• Walther T, Sobal N, Hilgendorff M & Giersig M (2002) Energy filtered TEM study of silver-cobalt nano-particles. 15th International Congress on Electron Microscopy, Vol. 3 (Interdisciplinary) (pp 261-262). Onderstepoort, 1 September 2002 - 6 September 2002.
• Walther T (2002) Spectrum imaging of thin films of oxides and perovskites. 15, Vol. 3 (Interdisciplinary) (pp 123-124). Onderstepoort, 1 September 2002 - 6 September 2002.
• Walther T (2002) Energy filtered TEM study of gold nano-particles on nano-crystalline anatase support. 15th International Congress on Electron Microscopy, Vol. 3 (Interdisciplinary) (pp 259-260). Onderstepoort, 1 September 2002 - 6 September 2002.
• Recnik A, Daneu N, Walther T, Kawasaki M & Mader W (2002) Solving the atomic structure of inversion boundaries in Sb2O3-doped zinc oxide. 15th International Congress on Electron Microscopy, Vol. 1 (Physics and Materials) (pp 531-532). Onderstepoort, 1 September 2002 - 6 September 2002.
• Walther T, Recnik A & Daneu N (2002) Test of a new analytical method to measure the composition of a planar fault. 15th International Congress on Electron Microscopy, Vol. 1 (Physics and Materials) (pp 535-536). Onderstepoort, 1 September 2002 - 6 September 2002.
• Cullis AG, Norris DJ, Walther T, Migliorato MA & Hopkinson M (2002) Epitaxial island growth and the Stranski-Krastanow transition. CURRENT ISSUES IN HETEROEPITAXIAL GROWTH-STRESS RELAXATION AND SELF ASSEMBLY, Vol. 696 (pp 3-10)
• Barf J, Walther T, Steinecker A & Mader W (2001) Exit wave reconstruction and elemental mapping of twin boundaries in the system ZnO-Ga2O3. Microscopy and Microanalysis, Vol. 7(Suppl. 2) (pp 290-291). New York, 2001 - 2001.
• Albrecht M, Grillo V, Borysiuk J, Remmele T, Strunk HP, Walther T, Mader W, Prystawko P, Leszczynski M, Grzegory I & Porowski S (2001) Correlating compositional, structural and optical properties of InGaN quantum wells by transmission electron microscopy. MICROSCOPY OF SEMICONDUCTING MATERIALS 2001(169) (pp 267-272)
• Walther T, Cullis AG, Norris DJ & Hopkinson M (2001) How InGaAs islands form on GaAs substrates: the missing link in the explanation of the Stranski-Krastanow transition. MICROSCOPY OF SEMICONDUCTING MATERIALS 2001(169) (pp 85-88)
• Barf J, Walther T & Mader W (2000) Structure and chemistry of domains and interfaces in Ga2O3-doped ZnO. 4th German-Slovenian Seminar on Joint Projects in Materials Science and Technology (pp 2-3). Stuttgart
• Daneu N, Walther T, Recnik A, Bernik S & Mader W (2000) Quantitative EDS analysis of inversion boundaries in Sn-doped ZnO. 4th German-Slovenian Seminar on Joint Projects in Materials Science and Technology (pp 14-15). Stuttgart
• Pidun M, Karduck P, Mayer J, Heime K, Schineller B & Walther T (2000) Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contacts on Si-doped GaN. Joint Meeting of the Belgian and Dutch Societies for Microscopy (pp 172-173). Rijnsburg, 2000 - 2000.
• Marko IP, Yablonskii GP, Gurskii AL, Lutsenko EV, Kalisch H, Heuken M, Walther T, Mader W & Heime K (2000) Thermal stability of ZnMgSSe / ZnSe laser heterostructures. ISCS-27. Piscataway, 2000 - 2000.
• Schulmeister K, Walther T & Mader W (2000) Structural and spectroscopic characterisation of amorphous silicon sub-oxides. 12th European Congress on Electron Microscopy, Vol. 2 (Physical Sciences) (pp 465-466). Brno, 9 July 2000 - 14 July 2000.
• Daneu N, Walther T, Recnik A, Bernik S & Mader W (2000) Structure and composition of inversion boundaries in Sn-doped ZnO. 12th European Congress on Electron Microscopy, Vol. 2 (Physical Sciences) (pp 435-436). Brno, 9 July 2000 - 14 July 2000.
• Recnik A, Ceh M, Daneu N, Walther T & Mader W (2000) Charge balance models for inversion boudnaries in ZnO. 12th European Congress on Electron Microscopy, Vol. 2 (Physical Sciences) (pp 437-438). Brno, 9 July 2000 - 14 July 2000.
• Walther T, Barf J & Mader W (2000) Quantification of segregation to grain boundaries and diffusion at interfaces by energy-filtered transmission electron microscopy. 12th European Congress on Electron Microscopy, Vol. 2 (Physical Sciences) (pp 409-412). Brno, 9 July 2000 - 14 July 2000.
• Pack A, Hoernes S & Walther T (2000) The behaviour of olivine in refractories used in steel making processes - Thermodynamic considerations. APPLIED MINERALOGY, VOLS 1 AND 2 (pp 875-878)
• Yan Y, Walther T & Kirk MA (1999) . Materials Research Society Fall Meeting, Vol. 540 (pp 267-272). Boston (book), cambridge (on-line), 1998 - 1998.
• Walther T & Mader W (1999) Application of spatially resolved electron energy-loss spectroscopy to the quantitative study of thin layer systems. Optik, Vol. 110(Suppl. 8) (pp 58-58). Dortmund
• Walther T & Mader W (1999) Investigation of gold nano-particles by energy-filtered imaging. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 243-248)
• Walther T & Mader W (1999) Application of spatially resolved electron energy-loss spectroscopy to the quantitative analysis of semiconducting layer structures. MICROSCOPY OF SEMICONDUCTING MATERIALS 1999, PROCEEDINGS(164) (pp 121-128)
• Walther T & Humphreys CJ (1997) Quantification of the composition of silicon germanium/silicon structures by high-angle annular dark field imaging. ELECTRON MICROSCOPY AND ANALYSIS 1997(153) (pp 303-306)
• Boothroyd CB, Dunin-Borkowski RE & Walther T (1997) Scattering distribution from semiconductors as a function of angle and energy loss in the electron microscope. Materials Research Society Symposium - Proceedings, Vol. 466 (pp 113-118)
• Walther T, Humphreys CJ, Cullis AG & Robbins DJ (1997) A study of interdiffusion and germanium segregation in low-pressure chemical vapour deposition of SiGe/Si quantum wells. MICROSCOPY OF SEMICONDUCTING MATERIALS 1997(157) (pp 47-54)
• DuninBorkowski RE, Schaublin RE, Walther T, Boothroyd CB, Preston AR & Stobbs WM (1995) The determination of absorption parameters in Si and GaAs using energy filtered imaging. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 179-182)
• Walther T, Schaublin RE, DuninBorkowski RE, Boothroyd CB, Humphreys CJ & Stobbs WM (1995) The role of plasmon scattering in the quantitative contrast analysis of high-resolution lattice images of GaAs. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 195-198)
• Walther T, Hetherington CJD & Humphreys CJ (1995) A contribution to the quantitative comparison of experimental high-resolution electron micrographs and image simulations. MICROSCOPY OF SEMICONDUCTING MATERIALS 1995, Vol. 146 (pp 53-56)
• Walther T & Humphreys CJ (1995) The limitations of pattern recognition and displacement measurement techniques for evaluating HREM images of strained semiconductor interfaces. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 103-106)
• Walther T, Boothroyd CB & Humphreys CJ (1995) Strain relaxation induced local crystal tilts at Si/SiGe interfaces in cross-sectional transmission electron microscope specimens. MICROSCOPY OF SEMICONDUCTING MATERIALS 1995, Vol. 146 (pp 11-16)
• Walther T, Gerthsen D, Carius R, Förster A & Urban K (1994) AlAs/GaAs quantum well structures: interface properties investigated by high-resolution transmission electron microscopy and photoluminescence spectroscopy. 4th International Conference on Formation of Semiconductor Interfaces (ICFSI-4) (pp 562-565). Singapore
• WALTHER T, BOOTHROYD CB, HUMPHREYS CJ & CULLIS AG (1994) The effect of thin crystal strain relaxation on high-resolution images of Si/Si0.8Ge0.2 quantum wells. ELECTRON MICROSCOPY 1994, VOL 1 (pp 365-366)
• WALTHER T, GERTHSEN D, CARIUS R, FORSTER A & URBAN K (1993) CORRELATION BETWEEN THE STRUCTURAL AND OPTICAL-PROPERTIES OF ALAS/GAAS QUANTUM-WELL STRUCTURES. MICROSCOPY OF SEMICONDUCTING MATERIALS 1993(134) (pp 449-454)
• Wang X & Walther T () (pp 893-894)
• Walther CG & Walther T () . Frontiers in BioImaging, 14 July 2016 - 15 July 2016.
• Angadi V & Walther T () . http://emag2016.iopconfs.org/, 6 April 2016 - 8 April 2016.
• Qiu Y, Krysa AB, Cullis AG & Walther T () Scanning transmission electron microscopy study of InP quantum dots. Photon '10, Vol. abstract booklet (pp P1-55). Southampton, 23 August 2010 - 26 August 2010.
• Nguyen VH, Dobbie A, Myronov M, Norris DJ, Walther T & Leadley DR () Epitaxial growth by RP-CVD of relaxed germanium layers on (110) and (111) silicon substrates. 7th Int. Conf. Silicon Epitaxy and Heterostructures (ICSI-7), Vol. abstract booklet. Leuven, 29 August 2011 - 2 September 2011.
• Walther T, Simon J & Stegmann H () Combining imaging with local spectroscopy in an energy-filtered TEM/STEM. Microscopy Congress 2005 (pp 240-240). Davos
• Daneu N, Recnik A, Walther T & Mader W () A new method of analytical TEM for the determination of very small amounts of dopants at interfaces. 8th Asian-Pacific Conf. on Electron Microscopy (pp 438-439). Tokyo, 2004 - 2004.
• Walther T, Boothroyd CB & Humphreys CJ () The dependence of the growth rate of LPCVD grown SiGe quantum wells on the Ge composition and the layer thickness. EUREM-11 (Europ. Conf. Electron Microscopy), Vol. 1 (pp 317-318). Brussels, 1996 - 1996.
• Walther T & Mader W () Methods for reliable elemental mapping despite low signal-to-noise ratios and overlapping ionisation edges. Dreiländertagung für Elektronenmikroskopie(abstract booklet) (pp 29-29). Innsbruck, 9 September 2001 - 14 September 2001.
• Walther T, Benner G, Stegmann H, Thesen A & Quandt E () First results from a monochromated and Cs-corrected 200kV STEM. EDGE 2005: Endhanced Data Generated with Electrons(abstract booklet) (pp 55-55). Grundlsee, 1 May 2005 - 5 May 2005.
• Chong RKK, Dunin-Borkowski RE, Walls MG, Tence M, Walther T, Gemming T, Bayle-Guillemaud P, Champion Y, Hytch MJ & Snoeck E () Round-robin results of the quantitative analysis of FeNi nanoparticle compositions. EDGE 2005: Endhanced Data Generated with Electrons(abstract booklet) (pp 50-50). Grundlsee, 1 May 2005 - 5 May 2005.
• Lutsenko EV, Zubialevich VZ, Pavlovskii VN, Marko IP, Gurskii AL, Yablonskii GP, Kalisch H, Walther T, Schoen O, Protzmann H , Luenenbuerger M et al () Optically pumped transverse lasers based on ZnMgSSe/ZnSe and InGaN/GaN heterostructures. Proceedings SPIE, Vol. 4751 (pp 542-548). Minsk
• Gerthsen D, Walther T & Rosenauer A () Quantitative high-resolution electron microscopy of semiconductor heterostructures. Japanese-German Forum on Information Technology (pp 6-10). Oita

Patents

• Walther T (2011) Collection of electromagnetic Radiation emitted from Particle-irradiated Samples. WO 2011030156 (A2) Appl. 17 Mar 2011.

Reports

• Walther T (2023) Defending the viva
• Walther CG & Walther T (2014) Book review of ‘Fundamentals of Fluorescence Microscopy’ by Partha Pratim Mondal and Alberto Diaspro, Springer, Dordrecht, 2014, ISBN: 978-94-007-7544-2
• Walther T (2014) Leserbrief zum Beitrag ‘Auswendig lernen und wieder vergessen’ by J. Loviscach (abbreviated commentary on teaching mathematics to engineering students; in German)
• Walther T (2011) Book review of 'Sample Preparation Handbook for Transmission Electron Microscopy' by J. Ayache, L. Beaunier, J. Boumendil, G Ehret, D. Laub (Springer, New York, 2010, ISBN 978-1-4419-5974-4), published in infocus magazine
• Quandt E, Walther T, Sehrbrock A & Wehner B (2005) Electron microscopy
• Quandt E, Walther T, Sehrbrock A & Wehner B (2005) Electron microscopy of TMR structures
• Ludwig A, Feydt J, Walther T & Zotov N (2005) Structural studies of Fe-Pt multilayers
• Ludwig A, Groudeva-Zotova S, Ehmann M, Feydt J, Savan A, Sehrbrock A, Walther T & Wehner B (2005) Structural and magnetic properties of FeCo films modified by combinatorial ion implantation
• Quandt E & Walther T (2004) Transmission electron microscopy
• Quandt E, Sehrbrock A, Walther T & Wehner B (2004) Electron microscopy at the Center for Advanced European Studies and Research
• Cullis AG, Norris DJ, Migliorato MA, Hopkinson M & Walther T (2003) Modelling of the Stranski-Krastanow transition and epitaxial island growth
• Walther T, Gerthsen D, Stenkamp D, Carius R & Förster A (1993) Korrelation optischer und struktureller Eigenschaften von AlAs/GaAs- Quantentopfstrukturen

Theses / Dissertations

• Walther T (1997) A study of compositional variations in semiconductor heterostructures by transmission electron microscopy. University of Cambridge.
• Walther T (1993) Untersuchung struktureller Eigenschaften von AlAs/GaAs- Quantentopfstrukturen mittels hochaufloesender Transmissions-Elektronenmikroskopie. RWTH Aachen.